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2000 – 2009
- 2009
[j5]A.-K. Tiedemann, K. Kurz, M. Fakhri, Ralf Heiderhoff
, J. C. H. Phang, L. J. Balk:
Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations. Microelectron. Reliab. 49(9-11): 1165-1168 (2009)- 2008
- [j4]D. Isakov, A. A. B. Tio, T. Geinzer, J. C. H. Phang, Y. Zhang, L. J. Balk:
Near-field detection of photon emission from silicon with 30 nm spatial resolution. Microelectron. Reliab. 48(8-9): 1285-1288 (2008) - 2003
- [j3]J. C. H. Phang, D. S. H. Chan, V. K. S. Ong, S. Kolachina, J. M. Chin, M. Palaniappan, G. Gilfeather, Y. X. Seah:
Single contact beam induced current phenomenon for microelectronic failure analysis. Microelectron. Reliab. 43(9-11): 1595-1602 (2003) - 2001
- [j2]J. M. Chin, J. C. H. Phang, D. S. H. Chan, M. Palaniappan, G. Gilfeather, C. E. Soh:
Single contact optical beam induced currents. Microelectron. Reliab. 41(8): 1237-1242 (2001) - [j1]M. Zmeck, J. C. H. Phang, Andrew Bettiol, T. Osipowicz, F. Watt, L. J. Balk, Franz-Josef Niedernostheide, Hans-Joachim Schulze, E. Falck, R. Barthelmess:
Analysis of high-power devices using proton beam induced charge microscopy. Microelectron. Reliab. 41(9-10): 1519-1524 (2001)
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