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Peter V. Pikhitsa

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2010 – 2019

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2018
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Eunhan Lee, Taewi Kim, Heeseong Suh, Minho Kim, Peter V. Pikhitsa, Seungyong Han, Je-Sung Koh, Daeshik Kang:
Effect of Metal Thickness on the Sensitivity of Crack-Based Sensors. Sensors 18(9): 2872 (2018)

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