default search action

combined dblp search
author search
venue search
publication search

ask others

Dongshin Kim 0004

> Home > Persons

Person information

affiliation: Korea Electronics Technology Institute, IT Application Research Center, Jeonju, South Korea

Other persons with the same name

see FAQ

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

2010 – 2019

see FAQ

What is the meaning of the colors in the publication lists?

2018
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/KimCPCJ18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/KimCPCJ18
Dongshin Kim, Ju-Hwan Choi, Nochang Park, Sung-Il Chan, Yongchae Jeong:
Analysis of semiconductor fault using DS (damped sinusoidal) HPEM injection. Microelectron. Reliab. 88-90: 411-417 (2018)

Coauthor Index

see FAQ

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.