BibTeX records: Young Heo

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  author    = {Younggeun Ji and
               Jeonghoon Kim and
               Jungin Kim and
               Miji Lee and
               Jaeheon Noh and
               Taeyoung Jeong and
               Juhyeon Shin and
               Junho Kim and
               Young Heo and
               Ung Cho and
               Hyun{-}Chul Sagong and
               Junekyun Park and
               Yeonsik Choo and
               Gilhwan Do and
               Hoyoung Kang and
               Eunkyeong Choi and
               Dongyoon Sun and
               Changki Kang and
               Sangchul Shin and
               Sangwoo Pae},
  title     = {Reliability characterization of advanced {CMOS} image sensor {(CIS)}
               with 3D stack and in-pixel {DTI}},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
               CA, USA, March 11-15, 2018},
  pages     = {3},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {},
  doi       = {10.1109/IRPS.2018.8353570},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {},
  bibsource = {dblp computer science bibliography,}
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