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Aihua Wu 0007

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affiliation: Hebei Semiconductor Research Institute, Metrology Centre, Shijiazhuang, China
affiliation (PhD 2007): Jilin University, Changchun, China

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2020 – today

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2020
[j2]
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Aihua Wu, Xingchang Fu, Chen Liu, Chong Li, Yibang Wang, Faguo Liang, Peng Luan:
Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems. IEEE Trans. Instrum. Meas. 69(6): 2837-2844 (2020)
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Peng Luan, Yibang Wang, Wei Zhao, Chen Liu, Faguo Liang, Aihua Wu, Jing Du:
Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy. IEEE Trans. Instrum. Meas. 69(11): 8874-8880 (2020)

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