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Rajesh Saha
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2020 – today
- 2024
- [j12]Prachuryya Subash Das, Deepjyoti Deb, Rupam Goswami
, Santanu Sharma, Rajesh Saha:
Fin core dimensionality and corner effect in dual core gate-all-around FinFET. Microelectron. J. 143: 105985 (2024) - [j11]Shreyas Tiwari, Rajesh Saha:
Sensitivity analysis of TMD TFET based photo-sensor for visible light detection: A simulation study. Microelectron. J. 143: 106035 (2024) - [j10]Rashi Chaudhary, Rajesh Saha, Menka Yadav
:
Analysis of thermal stability in underlap and overlap DMG FinFETs including self-heating effects. Microelectron. J. 146: 106152 (2024) - 2023
- [j9]Ravindra Kumar Maurya
, Rajesh Saha, Brinda Bhowmick
:
Low to high-frequency noise behavior investigation of steeper sub-threshold swing NC-GeFinFET. Microelectron. J. 131: 105642 (2023) - [j8]Rashi Chaudhary, Rajesh Saha
:
Impact of self-heating on RF/analog and linearity parameters of DMG FinFETs in underlap and overlap configurations. Microelectron. J. 135: 105765 (2023) - [j7]Ravindra Kumar Maurya
, Vivek Kumar, Rajesh Saha, Brinda Bhowmick
:
Effect of curie temperature on electrical parameters of NC-FinFET and digital switching application of NC-FinFET. Microelectron. J. 139: 105892 (2023) - 2022
- [j6]Deepjyoti Deb
, Rupam Goswami, Ratul Kr. Baruah, Kavindra Kandpal
, Rajesh Saha:
Parametric investigation and trap sensitivity of n-p-n double gate TFETs. Comput. Electr. Eng. 100: 107930 (2022) - [j5]Shreyas Tiwari, Rajesh Saha:
Improved optical performance in near visible light detection photosensor based on TFET. Microelectron. J. 129: 105554 (2022) - [j4]Ayush Mangla, Rajesh Saha
, Rupam Goswami:
Impact on performance of dual stack hetero- gated dielectric modulated TFET biosensor due to Si1-xGex pocket variation. Microelectron. J. 129: 105603 (2022) - [j3]Rajesh Saha
, Rupam Goswami, Deepak Kumar Panda
:
Analysis on electrical parameters including temperature and interface trap charges in gate overlap Ge source step shape double gate TFET. Microelectron. J. 130: 105629 (2022) - 2021
- [j2]Rajesh Saha:
Simulation study on ferroelectric layer thickness dependence RF/Analog and linearity parameters in ferroelectric tunnel junction TFET. Microelectron. J. 113: 105081 (2021) - [j1]Rajesh Saha, Abdullahil Azeem, Kazi Wahadul Hasan, Syed Mithun Ali
, Sanjoy Kumar Paul:
Integrated economic design of quality control and maintenance management: Implications for managing manufacturing process. Int. J. Syst. Assur. Eng. Manag. 12(2): 263-280 (2021)
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