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R. Keith Treece

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1990 – 1999

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1990
[c2]
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  - conf/itc/FritzemeierSTH90
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  - https://dblp.org/rec/conf/itc/FritzemeierSTH90
Ronald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins:
Increased CMOS IC stuck-at fault coverage with reduced I _DDQ test sets. ITC 1990: 427-435

1980 – 1989

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1989
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Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins:
CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. ITC 1989: 423-430

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