Reliability data's of 0.5 μm AlGaN/GaN on SiC technology qualification.

Sun, 01 Jan 2012 00:00:00 +0100

Benoit Lambert, Jim Thorpe, Reza Behtash, Bernd Schauwecker, Franck Bourgeois, Helmut Jung, Joëlle Bataille, Patrick Mezenge, Cyril Gourdon, Catherine Ollivier, Didier Floriot, Hervé Blanck:
Reliability data's of 0.5 μm AlGaN/GaN on SiC technology qualification. Microelectron. Reliab. 52(9-10): 2200-2204 (2012)