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Bo Krsnik

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1997
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Toshiaki Kirihata, Hing Wong, John K. DeBrosse, Yohji Watanabe, Takahiko Hara, Munehiro Yoshida, Matthew R. Wordeman, Shuso Fujii, Yoshiaki Asao, Bo Krsnik:
Flexible test mode approach for 256-Mb DRAM. IEEE J. Solid State Circuits 32(10): 1525-1534 (1997)

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