GAN-based Defect Image Generation for Imbalanced Defect Classification of OLED panels.

Sat, 01 Jan 2022 00:00:00 +0100

Yongmoon Jeon, Haneol Kim, Hyeona Lee, Seonghoon Jo, Jaewon Kim:
GAN-based Defect Image Generation for Imbalanced Defect Classification of OLED panels. EGSR (ST) 2022: 145-150