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BibTeX records: K. Tsuda
@inproceedings{DBLP:conf/irps/TakahashiOHKWTSMAOKYKIMO23, author = {H. Takahashi and Y. Okamoto and Toshiki Hamada and Yusuke Komura and S. Watanabe and K. Tsuda and H. Sawai and Takanori Matsuzaki and Yoshinori Ando and Tatsuya Onuki and Hitoshi Kunitake and Shunpei Yamazaki and D. Kobayashi and A. Ikuta and Takahiro Makino and Takeshi Ohshima}, title = {Soft- and Hard-Error Radiation Reliability of 228 {KB} {\textdollar}3{\textbackslash}mathrm\{T\}+1{\textbackslash}mathrm\{C\}{\textdollar} Oxide Semiconductor Memory}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey, CA, USA, March 26-30, 2023}, pages = {1--6}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/IRPS48203.2023.10118302}, doi = {10.1109/IRPS48203.2023.10118302}, timestamp = {Sun, 06 Oct 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/TakahashiOHKWTSMAOKYKIMO23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/KuriyamaSHATIO95, author = {Y. Kuriyama and T. Sugiyama and S. Hongo and J. Akagi and K. Tsuda and N. Iizuka and M. Obara}, title = {A 40-GHz D-type flip-flop using AlGaAs/GaAs HBT's}, journal = {{IEEE} J. Solid State Circuits}, volume = {30}, number = {10}, pages = {1128--1130}, year = {1995}, url = {https://doi.org/10.1109/4.466069}, doi = {10.1109/4.466069}, timestamp = {Wed, 03 May 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jssc/KuriyamaSHATIO95.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }

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