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Geun-Myeong Kim

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2023
[c1]
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Sunghwan Kim, Geun-Myeong Kim, Seong-Nam Kim, Saetbyeol Ahn, Yoon-Suk Kim, Inkook Jang, Kyoung-Woo Lee, Dae Sin Kim:
Structural Reliability and Performance Analysis of Backside PDN. VLSI Technology and Circuits 2023: 1-2

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