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Young-Gwan Kim

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2023
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Young-Mok Bae, Young-Gwan Kim, Jeong-Woo Seo, Hyun-A Kim, Chang-Ho Shin, Jeong-Hwan Son, Gyu-Ho Lee, Kwang-Jae Kim:
Detecting abnormal behavior of automatic test equipment using autoencoder with event log data. Comput. Ind. Eng. 183: 109547 (2023)

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