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F. M. Ciou

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2024
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Y. S. Lin, Cheng Hsun Yang, C. H. Wang, K. P. Sou, Cheng Hong Yang, M. C. Shih, W. S. Hung, W. H. Chuang, F. M. Ciou, P. C. Chiu, C. C. Hsu, C. F. Chen, D. M. Kuo:
HV-CV Analysis Trapping Behavior in 650V pGaN HEMT with Field Plates for High-Voltage Power Applications. IRPS 2024: 2

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