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Ronald J. Bolam

Ronald Bolam – Ron Bolam

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2020 – today

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2024
[c3]
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Ernest Y. Wu, Brian T. McGowan, Ronald Bolam, Huai Huang, Huimei Zhou, Miaomiao Wang:
A New Clustering-Function-Based Formulation of Temporal and Spatial Clustering Model Involving Area Scaling and its Application to Parameter Extraction. IRPS 2024: 1-9
2022
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Ernest Y. Wu, Ron Bolam, Baozhen Li, Tian Shen, Barry P. Linder, Griselda Bonilla, Miaomiao Wang, Dechao Guo:
A Flexible and Inherently Self-Consistent Methodology for MOL/BEOL/MIMCAP TDDB Applications with Excessive Variability-Induced Degradation. IRPS 2022: 2

2000 – 2009

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2005
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Terence B. Hook, Ronald J. Bolam, William Clark, Jay S. Burnham, Nivo Rovedo, Laura Schutz:
Negative bias temperature instability on three oxide thicknesses (1.4/2.2/5.2 nm) with nitridation variations and deuteration. Microelectron. Reliab. 45(1): 47-56 (2005)

1990 – 1999

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1999
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Terence B. Hook, Jay S. Burnham, Ronald J. Bolam:
Nitrided gate oxides for 3.3-V logic application: Reliability and device design considerations. IBM J. Res. Dev. 43(3): 393-406 (1999)
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Ghavam G. Shahidi, Atul Ajmera, Fariborz Assaderaghi, Ronald J. Bolam, Harold Hovel, Effendi Leobandung, Werner Rausch, Devendra Sadana, Dominic Schepis, Lawrence F. Wagner, Larry Wissel, Kun Wu, Bijan Davai:
Device and circuit design issues in SOI technology. CICC 1999: 339-346

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