default search action

combined dblp search
author search
venue search
publication search

ask others

Derek B. I. Feltham

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

1990 – 1999

see FAQ

What is the meaning of the colors in the publication lists?

1994
[j3]
- view
  authority control:
- export record
  dblp key:
  - journals/dt/MalyFGHBT94
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/MalyFGHBT94
Wojciech Maly, Derek B. I. Feltham, Anne E. Gattiker, Mark D. Hobaugh, Kenneth Backus, Michael E. Thomas:
Smart-Substrate Multichip-Module Systems. IEEE Des. Test Comput. 11(2): 64-73 (1994)
1993
[j2]
- view
  authority control:
- export record
  dblp key:
  - journals/jssc/KhareFM93
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/KhareFM93
Jitendra Khare, Derek B. I. Feltham, Wojciech Maly:
Accurate estimation of defect-related yield loss in reconfigurable VLSI circuits. IEEE J. Solid State Circuits 28(2): 146-156 (1993)
1992
[c2]
- view
  authority control:
- export record
  dblp key:
  - conf/eurodac/FelthamKM92
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/eurodac/FelthamKM92
Derek B. I. Feltham, Jitendra Khare, Wojciech Maly:
Design for testability view on placement and routing. EURO-DAC 1992: 382-387
1991
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/jssc/FelthamM91
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/FelthamM91
Derek B. I. Feltham, Wojciech Maly:
Physically realistic fault models for analog CMOS neural networks. IEEE J. Solid State Circuits 26(9): 1223-1229 (1991)

1980 – 1989

see FAQ

What is the meaning of the colors in the publication lists?

1988
[c1]
- view
  authority control:
- export record
  dblp key:
  - conf/iccd/FelthamNCM88
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccd/FelthamNCM88
Derek B. I. Feltham, Phil Nigh, L. Richard Carley, Wojciech Maly:
Current sensing for built-in testing of CMOS circuits. ICCD 1988: 454-457

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.