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Zhan Zheyu

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2025
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Zhan Zheyu, Hainan Liu, Duoli Li, Ma Quangang, Wenxin Zhao, Zhenzhen Yan, Bo Li:
Single-Event Upset Monitor-Based Radiation-Hardened Latch for Multi-Node Upset. IEEE Trans. Circuits Syst. II Express Briefs 72(8): 1093-1097 (2025)

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