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J. Thijsse

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2000 – 2009

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2008
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J. Thijsse, Olaf van der Sluis, J. A. W. van Dommelen, Willem D. van Driel, Marc G. D. Geers:
Characterization of semiconductor interfaces using a modified mixed mode bending apparatus. Microelectron. Reliab. 48(3): 401-407 (2008)

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