BibTeX records: Sang H. Baeg

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@article{DBLP:journals/mr/LiCNCWLCKSGBWW18,
  author    = {Yuanqing Li and
               Li Chen and
               Issam Nofal and
               Mo Chen and
               Haibin Wang and
               Rui Liu and
               Qingyu Chen and
               Milos Krstic and
               Shuting Shi and
               Gang Guo and
               Sang H. Baeg and
               Shi{-}Jie Wen and
               Richard Wong},
  title     = {Modeling and analysis of single-event transient sensitivity of a 65{\unicode{8239}}nm
               clock tree},
  journal   = {Microelectron. Reliab.},
  volume    = {87},
  pages     = {24--32},
  year      = {2018},
  url       = {https://doi.org/10.1016/j.microrel.2018.05.016},
  doi       = {10.1016/j.microrel.2018.05.016},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/LiCNCWLCKSGBWW18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangDWNCSSBLGCB18,
  author    = {Haibin Wang and
               Xixi Dai and
               Yangsheng Wang and
               Issam Nofal and
               Li Cai and
               Zicai Shen and
               Wanxiu Sun and
               Jinshun Bi and
               Bo Li and
               Gang Guo and
               Li Chen and
               Sang H. Baeg},
  title     = {A single event upset tolerant latch design},
  journal   = {Microelectron. Reliab.},
  volume    = {88-90},
  pages     = {909--913},
  year      = {2018},
  url       = {https://doi.org/10.1016/j.microrel.2018.07.019},
  doi       = {10.1016/j.microrel.2018.07.019},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/WangDWNCSSBLGCB18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/NofalEHGLCLWCBW17,
  author    = {Issam Nofal and
               Adrian Evans and
               A.{-}L. He and
               Gang Guo and
               Yuanqing Li and
               Li Chen and
               Rui Liu and
               Haibin Wang and
               Mo Chen and
               Sang H. Baeg and
               Shi{-}Jie Wen and
               Richard Wong},
  title     = {{BPPT} - Bulk potential protection technique for hardened sequentials},
  booktitle = {23rd {IEEE} International Symposium on On-Line Testing and Robust
               System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages     = {28--32},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://doi.org/10.1109/IOLTS.2017.8046194},
  doi       = {10.1109/IOLTS.2017.8046194},
  timestamp = {Wed, 20 Nov 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/iolts/NofalEHGLCLWCBW17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JunCB04,
  author    = {Hong Shin Jun and
               Sung Soo Chung and
               Sang H. Baeg},
  title     = {Removing {JTAG} Bottlenecks in System Interconnect Test},
  booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
               26-28, 2004, Charlotte, NC, {USA}},
  pages     = {173--180},
  publisher = {{IEEE} Computer Society},
  year      = {2004},
  url       = {https://doi.org/10.1109/TEST.2004.1386950},
  doi       = {10.1109/TEST.2004.1386950},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/JunCB04.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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