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Toshihiro Arima

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1970 – 1979

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1975
[c2]
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  dblp key:
  - conf/dac/FunatsuWA75
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  - https://dblp.org/rec/conf/dac/FunatsuWA75
Shigehiro Funatsu, Nobuo Wakatsuki, Toshihiro Arima:
Test generation systems in Japan. DAC 1975: 114-122
1974
[c1]
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Toshihiro Arima, Mitsukuni Tsuboya, Goro Amamiya, Jiro Okuda:
A new heuristic test generation algorithm for sequential circuits. DAC 1974: 169-176

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