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2020 – today
- 2026
[j8]Helia Hooshmand, Tobias Pahl, Poul Erik Hansen, Liwei Fu, Alexander Birk, Mirza Karamehmedovic, Peter Lehmann, Stephan Reichelt, Richard K. Leach, Samanta Piano:
Corrigendum to "Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology" [Journal of Computational Physics, 521 (2025), 1-21/113519]. J. Comput. Phys. 545: 114480 (2026)- 2025
- [j7]Helia Hooshmand
, Tobias Pahl, Poul Erik Hansen, Liwei Fu, Alexander Birk, Mirza Karamehmedovic, Peter Lehmann, Stephan Reichelt, Richard K. Leach, Samanta Piano:
Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology. J. Comput. Phys. 521: 113519 (2025) - 2023
- [j6]Jian Wang, Sheng Bi, Wenkang Liu, Liping Zhou, Tukun Li, Iain MacLeod, Richard K. Leach:
Stitching Locally Fitted T-Splines for Fast Fitting of Large-Scale Freeform Point Clouds. Sensors 23(24): 9816 (2023) - 2022
- [j5]Shah Karim, Samanta Piano, David T. Branson, Teguh Santoso, Richard K. Leach, Martin Tolley:
Real-time target alignment system for high-power high-repetition rate laser operations using a five degree-of-freedom hybrid mechanism. Int. J. Control 95(4): 867-885 (2022) - [j4]Anna Klimkowska, Stefano Cavazzi, Richard K. Leach, Stephen Grebby:
Detailed Three-Dimensional Building Façade Reconstruction: A Review on Applications, Data and Technologies. Remote. Sens. 14(11): 2579 (2022) - 2021
- [j3]Yassir Arezki, Rong Su, Ville Heikkinen, François Leprete, Pavel Psota, Youichi Bitou, Christian Schober, Charyar-Mehdi Souzani, Bandar Abdulrahman Mohammed Alzahrani, Xiangchao Zhang, Yohan Kondo, Christof Pruss, Vit Ledl, Nabil Anwer, Mohamed Lamjed Bouazizi, Richard K. Leach, Hichem Nouira:
Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level. Sensors 21(4): 1103 (2021) - [j2]Jian Wang, Zonghua Zhang, Richard K. Leach, Wenlong Lu, Jianfeng Xu:
Predistorting Projected Fringes for High-Accuracy 3-D Phase Mapping in Fringe Projection Profilometry. IEEE Trans. Instrum. Meas. 70: 1-9 (2021)
2010 – 2019
- 2018
- [c9]Petros Stavroulakis, Yael Bis-Kong, Elodie Doyen, Thomas Hartman, Richard K. Leach:
Digital Preservation of the Nottingham Ichthyosaur Using Fringe Projection. EuroMed (2) 2018: 38-44 - [c8]Richard K. Leach, Patrick Bointon, Xiaobing Feng, Simon Lawes, Samanta Piano, Nicola Senin, Danny Sims-Waterhouse, Petros Stavroulakis, Rong Su, Wahyudin P. Syam, Matthew Thomas:
Information-Rich Manufacturing Metrology. IPAS 2018: 145-157 - [c7]Petros Stavroulakis, Danny Sims-Waterhouse, Amrozia Shaheen, Sofia Catalucci, Patrick Bointon, Elodie Doyen, Yael Bis-Kong, Yorgos Tzimiropoulos, Richard K. Leach:
External Shape Measurement for Industrial Applications Using Artificial Intelligence and Optimised Data Fusion. IntelliSys (2) 2018: 1273-1281 - 2016
- [j1]Khalid Alblalaihid, Peter Kinnell, Simon Lawes, Dorian Desgaches, Richard K. Leach:
Performance Assessment of a New Variable Stiffness Probing System for Micro-CMMs. Sensors 16(4): 492 (2016) - 2014
- [c6]Dong-Yea Sheu, James D. Claverley, Richard K. Leach:
Testing the Mechanical Characteristics and Contacting Behaviour of Novel Manufactured and Assembled Sphere-Tipped Styli for Micro-CMM Probes. IPAS 2014: 15-21 - 2012
- [c5]James D. Claverley, Arne Burisch, Richard K. Leach, Annika Raatz:
Semi-automated Assembly of a MEMS-Based Micro-scale CMM Probe and Future Optimization of the Process Chain with a View to Desktop Factory Automation. IPAS 2012: 9-16 - 2010
- [c4]Daniel Smale, Steve Haley, Joel Segal, Ronaldo Ronaldo, Svetan M. Ratchev, Richard K. Leach, James D. Claverley:
Utilisation of FIB/SEM Technology in the Assembly of an Innovative Micro-CMM Probe. IPAS 2010: 105-112 - [c3]James D. Claverley, A. Georgi, Richard K. Leach:
Modelling the Interaction Forces between an Ideal Measurement Surface and the Stylus Tip of a Novel Vibrating Micro-scale CMM Probe. IPAS 2010: 131-138
2000 – 2009
- 2008
- [c2]Carsten Tietje, Richard K. Leach, Michele Turitto, Ronaldo Ronaldo, Svetan M. Ratchev:
Application of a DFµA Methodology to facilitate the assembly of a Micro/Nano Measurement Device. IPAS 2008: 5-12 - [c1]Richard K. Leach, Christopher W. Jones:
Towards a Traceable Infrastructure for Low Force Measurements. IPAS 2008: 307-314
Coauthor Index
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