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Hans-Peter Feuerbaum

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1980 – 1989

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1988
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Hironobu Niijima, Yasuo Tokunaga, Shouichi Koshizuka, Kazuo Yakuwa, Péter Fazekas, Mathias Sturm, Hans-Peter Feuerbaum:
Electron Beam Tester Integrated into a VLSI Tester. ITC 1988: 908-913

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