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Carl Monzel

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Journal Articles

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2016
[j1]
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  dblp key:
  - journals/tcas/GuptaMRZWB16
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  - https://dblp.org/rec/journals/tcas/GuptaMRZWB16
Saket Gupta, Carl Monzel, Daniel S. Reed, Yifei Zhang, Mark Winter, Myron Buer:
Bitcell-Based Design of On-Chip Process Variability Monitors for Sub-28 nm Memories. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(7): 1014-1022 (2016)

Conference and Workshop Papers

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2015
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  dblp key:
  - conf/irps/NarasimhamWVGBM15
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  - https://dblp.org/rec/conf/irps/NarasimhamWVGBM15
Balaji Narasimham, Jung K. Wang, Narayana Vedula, Saket Gupta, Brandon Bartz, Carl Monzel, Indranil Chatterjee, Bharat L. Bhuva, Ronald D. Schrimpf, Robert A. Reed:
Influence of supply voltage on the multi-cell upset soft error sensitivity of dual- and triple-well 28 nm CMOS SRAMs. IRPS 2015: 2
2005
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  - conf/isqed/CastagnettiVBMBTR05
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R. Castagnetti, R. Venkatraman, Brandon Bartz, Carl Monzel, T. Briscoe, Andres Teene, S. Ramesh:
A High-Performance SRAM Technology With Reduced Chip-Level Routing Congestion for SoC. ISQED 2005: 193-196

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