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André J. Hof

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2000 – 2009

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2007
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Cora Salm, Eric Hoekstra, Jay S. Kolhatkar, André J. Hof, Hans Wallinga, Jurriaan Schmitz:
Low-frequency noise in hot-carrier degraded nMOSFETs. Microelectron. Reliab. 47(4-5): 577-580 (2007)
2006
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Cora Salm, André J. Hof, Fred G. Kuper, Jurriaan Schmitz:
Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs. Microelectron. Reliab. 46(9-11): 1617-1622 (2006)

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