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Rutger J. van Asselt

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2003
[c1]
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  - https://dblp.org/rec/conf/caip/DijkGAVV03
Judith Dijk, Michael van Ginkel, Rutger J. van Asselt, Lucas J. van Vliet, Piet W. Verbeek:
A New Sharpness Measure Based on Gaussian Lines and Edges. CAIP 2003: 149-156

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