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J.-H. Shin

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1990 – 1999

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1996
[c1]
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  - https://dblp.org/rec/conf/ats/HurSLSLK96
Y.-M. Hur, J.-H. Shin, K.-H. Lee, Y.-S. Son, I.-C. Lim, Y.-H. Kim:
Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing. Asian Test Symposium 1996: 42-

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