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Pei-Fu Shen

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2000 – 2009

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2006
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Huawei Li, Pei-Fu Shen, Xiaowei Li:
Robust Test Generation for Precise Crosstalk-induced Path Delay Faults. VTS 2006: 300-305
2005
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Pei-Fu Shen, Huawei Li, Yongjun Xu, Xiaowei Li:
Non-robust Test Generation for Crosstalk-Induced Delay Faults. Asian Test Symposium 2005: 120-125

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