Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's.

Wed, 01 Jan 2003 00:00:00 +0100

Alberto Castellazzi , V. Kartal, R. Kraus, Norbert Seliger , Martin Honsberg-Riedl, Doris Schmitt-Landsiedel:
Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's. Microelectron. Reliab. 43(9-11): 1877-1882 (2003)