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M. Piton

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Journal Articles

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2007
[j5]
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Michel Mermet-Guyennet, X. Perpiñà, M. Piton:
Revisiting power cycling test for better life-time prediction in traction. Microelectron. Reliab. 47(9-11): 1690-1695 (2007)
[j4]
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X. Perpiñà, M. Piton, Michel Mermet-Guyennet, Xavier Jordà, José Millán:
Local thermal cycles determination in thermosyphon-cooled traction IGBT modules reproducing mission profiles. Microelectron. Reliab. 47(9-11): 1701-1706 (2007)
[j3]
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Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, M. Piton, Michel Mermet-Guyennet:
A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs. Microelectron. Reliab. 47(9-11): 1713-1718 (2007)
[j2]
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Jesús Urresti-Ibañez, Alberto Castellazzi, M. Piton, José Rebollo, Michel Mermet-Guyennet, Mauro Ciappa:
Robustness test and failure analysis of IGBT modules during turn-off. Microelectron. Reliab. 47(9-11): 1725-1729 (2007)
[j1]
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X. Perpiñà, Alberto Castellazzi, M. Piton, Michel Mermet-Guyennet, José Millán:
Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities. Microelectron. Reliab. 47(9-11): 1784-1789 (2007)

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