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ORCIDTakehiko Oe
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2020 – today
- 2023
[j17]Shuji Nakamura
, Daiki Matsumaru, Gento Yamahata, Takehiko Oe, Yuma Okazaki, Shintaro Takada, Michitaka Maruyama, Akira Fujiwara, Nobu-hisa Kaneko:
Cryogenic Operation of Electromechanical Relay for Reversal of Quantized Current Generated by a Single-Electron Pump. IEEE Trans. Instrum. Meas. 72: 1-9 (2023)- 2020
- [j16]Takehiko Oe, Albert F. Rigosi, Mattias Kruskopf, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Randolph E. Elmquist, Nobu-hisa Kaneko, Dean G. Jarrett:
Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices. IEEE Trans. Instrum. Meas. 69(6): 3103-3108 (2020)
2010 – 2019
- 2019
- [j15]Takayuki Abe, Takehiko Oe, Masaya Kumagai, Matsuo Zama, Nobu-hisa Kaneko:
Characterization of $1~\mathrm{k}\Omega$ Metal-Foil Standard Resistors and Continuing Drift-Rate Evaluation of 1 $\Omega$ and $10~\Omega$ Standard Resistors. IEEE Trans. Instrum. Meas. 68(6): 2078-2083 (2019) - 2017
- [j14]Atsushi Domae, Takehiko Oe, Syogo Kiryu, Nobu-hisa Kaneko:
Experimental Demonstration of Current Dependence Evaluation of Voltage Divider Based on Quantized Hall Resistance Voltage Divider. IEEE Trans. Instrum. Meas. 66(6): 1237-1242 (2017) - [j13]Takehiko Oe, Sucheta Gorwadkar, Taro Itatani, Nobu-hisa Kaneko:
Development of 1 MΩ Quantum Hall Array Resistance Standards. IEEE Trans. Instrum. Meas. 66(6): 1475-1481 (2017) - [j12]Nobu-hisa Kaneko, Takehiko Oe, Takayuki Abe, Masaya Kumagai, Matsuo Zama:
Development of 1~Ω and 10~Ω Metal-Foil Standard Resistors. IEEE Trans. Instrum. Meas. 66(6): 1482-1488 (2017) - [j11]Takehiko Oe, Atsushi Domae, Norihiko Sakamoto, Nobu-hisa Kaneko:
Evaluation of Automatic Coaxial Mechanical Scanners for Precise Resistance and Capacitance Measurements. IEEE Trans. Instrum. Meas. 66(6): 1560-1565 (2017) - 2015
- [j10]Takehiko Oe, Chiharu Urano, Nobu-hisa Kaneko, Hiroshi Eisaki, Yoshiyuki Yoshida, Atsushi Yamamoto, Koshi Takenaka:
Antiperovskite Manganese Nitride Standard Resistor. IEEE Trans. Instrum. Meas. 64(6): 1446-1450 (2015) - [j9]Atsushi Domae, Takayuki Abe, Masaya Kumagai, Matsuo Zama, Takehiko Oe, Nobu-hisa Kaneko:
Development and Evaluation of High-Stability Metal-Foil Resistor With a Resistance of 1 kΩ. IEEE Trans. Instrum. Meas. 64(6): 1490-1495 (2015) - [j8]Nobu-hisa Kaneko, Takehiko Oe, Wan-Seop Kim, Dong-Hun Chae, Randolph E. Elmquist, Marlin Kraft:
Transportation Effect and Basic Characteristics of Metal-Foil Resistors Examined in an International Trilateral Pilot Study. IEEE Trans. Instrum. Meas. 64(6): 1514-1519 (2015) - 2013
- [j7]Takehiko Oe, Chiharu Urano, Motoyoshi Hadano, Atsushi Ozawa, Koshi Takenaka, Nobu-hisa Kaneko:
Optimization of Mn3Ag1-x CuxN Antiperovskite Compound Fabrication for Resistance Standard. IEEE Trans. Instrum. Meas. 62(6): 1450-1453 (2013) - [j6]Nobu-hisa Kaneko, Atsushi Domae, Takehiko Oe, Jürgen Schurr, Franz-Josef Ahlers, Shogo Kiryu:
First Attempt to Develop an On-Chip Double-Shielded QHR Device for Use in AC Measurements. IEEE Trans. Instrum. Meas. 62(6): 1743-1748 (2013) - [j5]Takehiko Oe, Kenjiro Matsuhiro, Taro Itatani, Sucheta Gorwadkar, Shogo Kiryu, Nobu-hisa Kaneko:
New Design of Quantized Hall Resistance Array Device. IEEE Trans. Instrum. Meas. 62(6): 1755-1759 (2013) - [j4]Atsushi Domae, Takehiko Oe, Masaya Kumagai, Matsuo Zama, Nobu-hisa Kaneko:
Characterization of 100-Ω Metal Foil Standard Resistors. IEEE Trans. Instrum. Meas. 62(6): 1776-1782 (2013) - 2011
- [j3]Yasuhiko Sakamoto, Nobu-hisa Kaneko, Takehiko Oe, Masaya Kumagai, Matsuo Zama:
Novel 100-Omega Metal Foil Resistor. IEEE Trans. Instrum. Meas. 60(7): 2544-2549 (2011) - [j2]Takehiko Oe, Kenjiro Matsuhiro, Taro Itatani, Sucheta Gorwadkar, Shogo Kiryu, Nobu-hisa Kaneko:
Development of Quantum Hall Array Resistance Standards at NMIJ. IEEE Trans. Instrum. Meas. 60(7): 2590-2595 (2011) - [j1]Atsushi Domae, Yasuhiro Nakamura, Takehiko Oe:
Development of Quadrature Bridge for AC QHR Measurements at Measurement Frequency of 1.592 kHz. IEEE Trans. Instrum. Meas. 60(7): 2602-2608 (2011)
Coauthor Index
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