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P. Hosier

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1990 – 1999

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1996
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  - journals/ibmrd/ZieglerCMMCNRWFHLWOUROMSSYETSTSKW96
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James F. Ziegler, Huntington W. Curtis, Hans P. Muhlfeld, Charles J. Montrose, B. Chin, Michael Nicewicz, C. A. Russell, Wen Y. Wang, Leo B. Freeman, P. Hosier, L. E. LaFave, James L. Walsh, José M. Orro, G. J. Unger, John M. Ross, Timothy J. O'Gorman, B. Messina, Timothy D. Sullivan, A. J. Sykes, Hannon S. Yourke, Thomas A. Enger, Vikram R. Tolat, T. S. Scott, Allen H. Taber, R. J. Sussman, W. A. Klein, C. W. Wahaus:
IBM experiments in soft fails in computer electronics (1978-1994). IBM J. Res. Dev. 40(1): 3-18 (1996)

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