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2020 – today
- 2024
[j40]Fanny Spagnolo
, Stefania Perri, Massimo Vatalaro, Fabio Frustaci, Felice Crupi, Pasquale Corsonello:
Exploring the Usage of Fast Carry Chains to Implement Multistage Ring Oscillators on FPGAs: Design and Characterization. IEEE Trans. Very Large Scale Integr. Syst. 32(8): 1472-1484 (2024)- 2023
- [j39]Luigi Fassio, Longyang Lin, Raffaele De Rose, Marco Lanuzza, Felice Crupi, Massimo Alioto:
Voltage Reference With Corner-Aware Replica Selection/Merging for 1.4-mV Accuracy in Harvested Systems Down to 3.9 pW, 0.2 V. IEEE Access 11: 3584-3596 (2023) - [j38]Tatiana Moposita, Esteban Garzón, Raffaele De Rose, Felice Crupi, Andrei Vladimirescu, Lionel Trojman, Marco Lanuzza:
SIMPLY+: A Reliable STT-MRAM-Based Smart Material Implication Architecture for In-Memory Computing. IEEE Access 11: 144084-144094 (2023) - [j37]Tatiana Moposita, Esteban Garzón, Felice Crupi, Lionel Trojman, Andrei Vladimirescu, Marco Lanuzza:
Efficiency of Double-Barrier Magnetic Tunnel Junction-Based Digital eNVM Array for Neuro-Inspired Computing. IEEE Trans. Circuits Syst. II Express Briefs 70(3): 1254-1258 (2023) - [c24]Marco Mercuri, Patrizia Vizza, Pierangelo Veltri, Felice Crupi:
OSA evaluation by using clinical parameters monitoring system based on Radar Technology. EWSN 2023: 297-298 - [i3]Massimo Vatalaro, H. Neill, F. Gity, Paolo Magnone, V. Maccaronio, C. Márquez, J. C. Galdon, F. Gamiz, Felice Crupi, P. Hurley, Raffaele De Rose:
Experimental analysis of variability in WS2-based devices for hardware security. CoRR abs/2308.02265 (2023) - 2022
- [j36]Massimo Vatalaro, Raffaele De Rose, Marco Lanuzza, Felice Crupi:
Static CMOS Physically Unclonable Function Based on 4T Voltage Divider With 0.6%-1.5% Bit Instability at 0.4-1.8 V Operation in 180 nm. IEEE J. Solid State Circuits 57(8): 2509-2520 (2022) - [j35]Marco Mercuri, Tom Torfs, Maxim Rykunov, Stefano Laureti, Marco Ricci, Felice Crupi:
Analysis of Signal Processing Methods to Reject the DC Offset Contribution of Static Reflectors in FMCW Radar-Based Vital Signs Monitoring. Sensors 22(24): 9697 (2022) - [j34]Stefano Laureti, Marco Mercuri, David Hutchins, Felice Crupi, Marco Ricci:
Modified FMCW Scheme for Improved Ultrasonic Positioning and Ranging of Unmanned Ground Vehicles at Distances < 50 mm. Sensors 22(24): 9899 (2022) - [j33]Benjamin Zambrano, Esteban Garzón, Sebastiano Strangio, Felice Crupi, Marco Lanuzza:
A 0.05 mm², 350 mV, 14 nW Fully-Integrated Temperature Sensor in 180-nm CMOS. IEEE Trans. Circuits Syst. II Express Briefs 69(3): 749-753 (2022) - [c23]Massimo Vatalaro, Raffaele De Rose, Marco Lanuzza, Felice Crupi:
Stability-Area Trade-off in Static CMOS PUF Based on 4T Subthreshold Voltage Divider. ICECS 2022 2022: 1-4 - [c22]Tatiana Moposita, Lionel Trojman, Felice Crupi, Marco Lanuzza, Andrei Vladimirescu:
Voltage-to-Voltage Sigmoid Neuron Activation Function Design for Artificial Neural Networks. LASCAS 2022: 1-4 - [i2]Esteban Garzón, Raffaele De Rose, Felice Crupi, Lionel Trojman, Adam Teman, Marco Lanuzza:
Adjusting Thermal Stability in Double-Barrier MTJ for Energy Improvement in Cryogenic STT-MRAMs. CoRR abs/2204.09395 (2022) - [i1]Raffaele De Rose, Tommaso Zanotti, Francesco Maria Puglisi, Felice Crupi, Paolo Pavan, Marco Lanuzza:
Smart Material Implication Using Spin-Transfer Torque Magnetic Tunnel Junctions for Logic-in-Memory Computing. CoRR abs/2205.09388 (2022) - 2021
- [j32]Luigi Fassio, Longyang Lin, Raffaele De Rose, Marco Lanuzza, Felice Crupi, Massimo Alioto:
Trimming-Less Voltage Reference for Highly Uncertain Harvesting Down to 0.25 V, 5.4 pW. IEEE J. Solid State Circuits 56(10): 3134-3144 (2021) - [j31]Luigi Fassio, Francesco Settino, Longyang Lin, Raffaele De Rose, Marco Lanuzza, Felice Crupi, Massimo Alioto:
A Robust, High-Speed and Energy-Efficient Ultralow-Voltage Level Shifter. IEEE Trans. Circuits Syst. II Express Briefs 68(4): 1393-1397 (2021) - [j30]Luigi Fassio, Longyang Lin, Raffaele De Rose, Marco Lanuzza, Felice Crupi, Massimo Alioto:
A 0.6-to-1.8V CMOS Current Reference With Near-100% Power Utilization. IEEE Trans. Circuits Syst. II Express Briefs 68(9): 3038-3042 (2021) - [c21]Luigi Fassio, Longyang Lin, Raffaele De Rose, Marco Lanuzza, Felice Crupi, Massimo Alioto:
A 3.2-pW, 0.2-V Trimming-Less Voltage Reference with 1.4-mV Across-Wafer Total Accuracy. ESSCIRC 2021: 343-346 - [c20]Carmelo Felicetti, Marco Lanuzza, Antonino Rullo, Domenico Saccà, Felice Crupi:
Exploiting Silicon Fingerprint for Device Authentication Using CMOS-PUF and ECC. SmartIoT 2021: 229-236 - 2020
- [j29]Esteban Garzón, Raffaele De Rose, Felice Crupi, Lionel Trojman, Giovanni Finocchio, Mario Carpentieri, Marco Lanuzza:
Assessment of STT-MRAMs based on double-barrier MTJs for cache applications by means of a device-to-system level simulation framework. Integr. 71: 56-69 (2020) - [c19]Luigi Fassio, Longyang Lin, Raffaele De Rose, Marco Lanuzza, Felice Crupi, Massimo Alioto:
A 0.25-V, 5.3-pW Voltage Reference with 25-μV/°C Temperature Coefficient, 140-μV/V Line Sensitivity and 2, 200-μm2 Area in 180nm. VLSI Circuits 2020: 1-2
2010 – 2019
- 2019
- [c18]Marco Lanuzza, Raffaele De Rose, Esteban Garzón, Felice Crupi:
Evaluating the Energy Efficiency of STT-MRAMs Based on Perpendicular MTJs with Double Reference Layers. ASICON 2019: 1-4 - [c17]Davide Cornigli, Andrea Natale Tallarico, Susanna Reggiani, Claudio Fiegna, Enrico Sangiorgi, Luis Sanchez, Carlos Valdivieso, Giuseppe Consentino, Felice Crupi:
Characterization and Modeling of BTI in SiC MOSFETs. ESSDERC 2019: 82-85 - [c16]Esteban Garzón, Raffaele De Rose, Felice Crupi, Marco Lanuzza:
Device-to-System Level Simulation Framework for STT-DMTJ Based Cache Memory. ICECS 2019: 123-124 - [c15]Marco Lanuzza, Raffaele De Rose, Felice Crupi, Massimo Alioto:
An Energy Aware Variation-Tolerant Writing Termination Control for STT-based Non Volatile Flip-Flops. ICECS 2019: 158-161 - [c14]Carmelo Felicetti, Angelo Furfaro, Domenico Saccà, Massimo Vatalaro, Marco Lanuzza, Felice Crupi:
Making IoT Services Accountable: A Solution Based on Blockchain and Physically Unclonable Functions. IDCS 2019: 294-305 - [c13]Esteban Garzón, Raffaele De Rose, Felice Crupi, Lionel Trojman, Giovanni Finocchio, Mario Carpentieri, Marco Lanuzza:
Exploiting Double-Barrier MTJs for Energy-Efficient Nanoscaled STT-MRAMs. SMACD 2019: 85-88 - 2018
- [j28]Felice Crupi, Raffaele De Rose, Maksym Paliy, Marco Lanuzza, Mattia Perna, Giuseppe Iannaccone:
A portable class of 3-transistor current references with low-power sub-0.5 V operation. Int. J. Circuit Theory Appl. 46(4): 779-795 (2018) - [j27]Raffaele De Rose, Marco Lanuzza, Felice Crupi, Giulio Siracusano, Riccardo Tomasello, Giovanni Finocchio, Mario Carpentieri, Massimo Alioto:
A Variation-Aware Timing Modeling Approach for Write Operation in Hybrid CMOS/STT-MTJ Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(3): 1086-1095 (2018) - [c12]Raffaele De Rose, Felice Crupi, Maksym Paliy, Marco Lanuzza, Giuseppe Iannaccone:
Design of a 3T current reference for low-voltage, low-power operation. ICICDT 2018: 13-16 - [c11]Noemi Guerra, Raffaele De Rose, Marco Guevara, Paul Procel, Marco Lanuzza, Felice Crupi:
Impact of the Emitter Contact Pattern in c-Si BC- BJ Solar Cells by Numerical Simulations. RTSI 2018: 1-4 - 2017
- [j26]Raffaele De Rose, Felice Crupi, Marco Lanuzza, Domenico Albano:
A physical unclonable function based on a 2-transistor subthreshold voltage divider. Int. J. Circuit Theory Appl. 45(2): 260-273 (2017) - [j25]Marco Lanuzza, Felice Crupi, Sandro Rao, Raffaele De Rose, Giuseppe Iannaccone:
Low energy/delay overhead level shifter for wide-range voltage conversion. Int. J. Circuit Theory Appl. 45(11): 1637-1646 (2017) - [j24]Marco Lanuzza, Felice Crupi, Sandro Rao, Raffaele De Rose, Sebastiano Strangio, Giuseppe Iannaccone:
An Ultralow-Voltage Energy-Efficient Level Shifter. IEEE Trans. Circuits Syst. II Express Briefs 64-II(1): 61-65 (2017) - [c10]Raffaele De Rose, Domenico Albano, Felice Crupi, Marco Lanuzza:
Design of a sub-1-V nanopower CMOS current reference. ECCTD 2017: 1-4 - [c9]Raffaele De Rose, Marco Lanuzza, Felice Crupi, Giulio Siracusano, Riccardo Tomasello, Giovanni Finocchio, Mario Carpentieri, Massimo Alioto:
A variation-aware simulation framework for hybrid CMOS/spintronic circuits. ISCAS 2017: 1-4 - [c8]Raffaele De Rose, Greta Carangelo, Marco Lanuzza, Felice Crupi, Giovanni Finocchio, Mario Carpentieri:
Impact of voltage scaling on STT-MRAMs through a variability-aware simulation framework. SMACD 2017: 1-4 - 2015
- [j23]Luca Magnelli, Felice Crupi, Pasquale Corsonello, Giuseppe Iannaccone:
A sub-1 V nanopower temperature-compensated sub-threshold CMOS voltage reference with 0.065%/V line sensitivity. Int. J. Circuit Theory Appl. 43(4): 421-426 (2015) - [j22]Domenico Albano, Marco Lanuzza, Ramiro Taco, Felice Crupi:
Gate-level body biasing for subthreshold logic circuits: analytical modeling and design guidelines. Int. J. Circuit Theory Appl. 43(11): 1523-1540 (2015) - [j21]Domenico Albano, Felice Crupi, Francesca Cucchi, Giuseppe Iannaccone:
A Sub-kT/q Voltage Reference Operating at 150 mV. IEEE Trans. Very Large Scale Integr. Syst. 23(8): 1547-1551 (2015) - [c7]Ben Kaczer, Jacopo Franco, M. Cho, Tibor Grasser, Philippe J. Roussel, Stanislav Tyaginov, M. Bina, Yannick Wimmer, Luis-Miguel Procel, Lionel Trojman, Felice Crupi, Gregory Pitner, Vamsi Putcha, Pieter Weckx, Erik Bury, Z. Ji, An De Keersgieter, Thomas Chiarella, Naoto Horiguchi, Guido Groeseneken, Aaron Thean:
Origins and implications of increased channel hot carrier variability in nFinFETs. IRPS 2015: 3 - 2014
- [j20]Luca Magnelli, Francesco A. Amoroso, Felice Crupi, Gregorio Cappuccino, Giuseppe Iannaccone:
Design of a 75-nW, 0.5-V subthreshold complementary metal-oxide-semiconductor operational amplifier. Int. J. Circuit Theory Appl. 42(9): 967-977 (2014) - [j19]Domenico Albano, Felice Crupi, Francesca Cucchi, Giuseppe Iannaccone:
A picopower temperature-compensated, subthreshold CMOS voltage reference. Int. J. Circuit Theory Appl. 42(12): 1306-1318 (2014) - [c6]Sebastiano Strangio, Pierpaolo Palestri, David Esseni, Luca Selmi, Felice Crupi:
Analysis of TFET based 6T SRAM cells implemented with state of the art silicon nanowires. ESSDERC 2014: 282-285 - 2013
- [c5]Marc Aoulaiche, Eddy Simoen, Romain Ritzenthaler, Tom Schram, Hiroaki Arimura, Moonju Cho, Thomas Kauerauf, Guido Groeseneken, Naoto Horiguchi, Aaron Thean, Antonio Federico, Felice Crupi, Alessio Spessot, Christian Caillat, Pierre Fazan, Hyuokju Na, Y. Son, K. B. Noh:
Impact of Al2O3 position on performances and reliability in high-k metal gated DRAM periphery transistors. ESSDERC 2013: 190-193 - 2012
- [j18]Jacopo Franco, S. Graziano, Ben Kaczer, Felice Crupi, Lars-Åke Ragnarsson, Tibor Grasser, Guido Groeseneken:
BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic. Microelectron. Reliab. 52(9-10): 1932-1935 (2012) - [j17]Raffaele De Rose, Antonio Malomo, Paolo Magnone, Felice Crupi, Giorgio Cellere, Marco Martire, Diego Tonini, Enrico Sangiorgi:
A methodology to account for the finger interruptions in solar cell performance. Microelectron. Reliab. 52(9-10): 2500-2503 (2012) - [j16]Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Mitsuhiro Togo, N. Horiguchi, Guido Groeseneken:
Understanding the Basic Advantages of Bulk FinFETs for Sub- and Near-Threshold Logic Circuits From Device Measurements. IEEE Trans. Circuits Syst. II Express Briefs 59-II(7): 439-442 (2012) - [j15]Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Ben Kaczer, Guido Groeseneken, Jérôme Mitard, Liesbeth Witters, Thomas Y. Hoffmann:
Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling. IEEE Trans. Very Large Scale Integr. Syst. 20(8): 1487-1495 (2012) - [c4]Tommaso Romeo, Luigi Pantisano, Eddy Simoen, Raymond Krom, Mitsuhiro Togo, N. Horiguchi, Jérôme Mitard, Aaron Thean, Guido Groeseneken, Cor Claeys, Felice Crupi:
Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs. ESSDERC 2012: 330-333 - [c3]Jacopo Franco, Ben Kaczer, Jérôme Mitard, Maria Toledano-Luque, Felice Crupi, Geert Eneman, Ph. J. Rousse, Tibor Grasser, M. Cho, Thomas Kauerauf, Liesbeth Witters, Geert Hellings, L.-Å. Ragnarsson, Naoto Horiguchi, Marc M. Heyns, Guido Groeseneken:
Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications. ICICDT 2012: 1-4 - 2011
- [j14]Luca Magnelli, Felice Crupi, Pasquale Corsonello, Calogero Pace, Giuseppe Iannaccone:
A 2.6 nW, 0.45 V Temperature-Compensated Subthreshold CMOS Voltage Reference. IEEE J. Solid State Circuits 46(2): 465-474 (2011) - [j13]Paolo Magnone, Felice Crupi, Massimo Alioto, Ben Kaczer, Brice De Jaeger:
Understanding the Potential and the Limits of Germanium pMOSFETs for VLSI Circuits From Experimental Measurements. IEEE Trans. Very Large Scale Integr. Syst. 19(9): 1569-1582 (2011) - [c2]Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Ben Kaczer, Guido Groeseneken, Jérôme Mitard, Liesbeth Witters, Thomas Y. Hoffmann:
Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling. ISCAS 2011: 2249-2252 - 2010
- [c1]Paolo Magnone, Felice Crupi, Massimo Alioto, Ben Kaczer:
Experimental study of leakage-delay trade-off in Germanium pMOSFETs for logic circuits. ISCAS 2010: 1699-1702
2000 – 2009
- 2009
- [j12]Gino Giusi, Calogero Pace, Felice Crupi:
Cross-correlation-based trans-impedance amplifier for current noise measurements. Int. J. Circuit Theory Appl. 37(6): 781-792 (2009) - [j11]Gino Giusi, Felice Crupi, Calogero Pace, Paolo Magnone:
Full Model and Characterization of Noise in Operational Amplifier. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(1): 97-102 (2009) - 2008
- [j10]Calogero Pace, Gino Giusi, Felice Crupi, Salvatore Lombardo:
Detection and Classification of Single-Electron Jumps in Si Nanocrystal Memories. IEEE Trans. Instrum. Meas. 57(2): 364-368 (2008) - 2007
- [j9]Paolo Srinivasan, Felice Crupi, Eddy Simoen, Paolo Magnone, Calogero Pace, Durga Misra, Cor Claeys:
Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks. Microelectron. Reliab. 47(4-5): 501-504 (2007) - [j8]Paolo Magnone, Calogero Pace, Felice Crupi, Gino Giusi:
Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics. Microelectron. Reliab. 47(12): 2109-2113 (2007) - [j7]Carmine Ciofi, Felice Crupi, Calogero Pace, Graziella Scandurra, Maurizio Patane:
A New Circuit Topology for the Realization of Very Low-Noise Wide-Bandwidth Transimpedance Amplifier. IEEE Trans. Instrum. Meas. 56(5): 1626-1631 (2007) - 2006
- [j6]Carmine Ciofi, Felice Crupi, Calogero Pace, Graziella Scandurra:
How to enlarge the bandwidth without increasing the noise in OP-AMP-based transimpedance amplifier. IEEE Trans. Instrum. Meas. 55(3): 814-819 (2006) - [j5]Felice Crupi, Gino Giusi, Carmine Ciofi, Calogero Pace:
Enhanced sensitivity cross-correlation method for voltage noise measurements. IEEE Trans. Instrum. Meas. 55(4): 1143-1147 (2006) - 2004
- [j4]A. Nannipieri, Giuseppe Iannaccone, Felice Crupi:
Extraction of the trap distribution responsible for SILCs in MOS structures from the measurements and simulations of DC and noise properties. Microelectron. Reliab. 44(9-11): 1497-1501 (2004) - 2003
- [j3]Calogero Pace, Carmine Ciofi, Felice Crupi:
Very low-noise, high-accuracy programmable voltage reference. IEEE Trans. Instrum. Meas. 52(4): 1251-1254 (2003) - [j2]Carmine Ciofi, Felice Crupi, Calogero Pace, Graziella Scandurra:
Micro-prober for wafer-level low-noise measurements in MOS devices. IEEE Trans. Instrum. Meas. 52(5): 1533-1536 (2003) - 2002
- [j1]Carmine Ciofi, Felice Crupi, Calogero Pace:
A new method for high-sensitivity noise measurements. IEEE Trans. Instrum. Meas. 51(4): 656-659 (2002)
Coauthor Index
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