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V. Y. Skobtsov

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Conference and Workshop Papers

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2010
[c1]
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Yuriy A. Skobtsov, V. Y. Skobtsov:
Evolutionary approach to test generation of sequential digital circuits with multiple observation time strategy. EWDTS 2010: 286-291

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2010
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Yuriy A. Skobtsov, D. E. Ivanov, V. Y. Skobtsov, Raimund Ubar, Jaan Raik:
Evolutionary Approach to Test Generation for Functional BIST. CoRR abs/1008.0063 (2010)

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