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2020 – today
- 2023
[j10]Josep Altet
, Xavier Aragonès, Enrique Barajas, Xavier Gisbert, Sergio Martínez, Diego Mateo:
Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements. Sensors 23(16): 7069 (2023)- [c16]Max Doblas, Gerard Candón, Xavier Carril, Marc Domínguez, Enric Erra, Alberto González, César Hernández, Víctor Jiménez, Vatistas Kostalampros, Rubén Langarita, Neiel Leyva, Guillem López-Paradís, Jonnatan Mendoza, Josep Oltra, Julián Pavón, Cristóbal Ramírez, Narcís Rodas, Enrico Reggiani, Mario Rodríguez, Carlos Rojas, Abraham Ruiz, Hugo Safadi, Víctor Soria, Alejandro Suanes, Iván Vargas, Fernando Arreza, Roger Figueras, Pau Fontova-Musté, Joan Marimon, Ricardo Martínez, Sergio Moreno, Jordi Sacristán, Oscar Alonso, Xavier Aragonès, Adrián Cristal, Ángel Diéguez, Manuel López, Diego Mateo, Francesc Moll, Miquel Moretó, Oscar Palomar, Marco A. Ramírez, Francisco Serra-Graells, Nehir Sönmez, Lluís Terés, Osman S. Unsal, Mateo Valero, Luis Villa:
Sargantana: An Academic SoC RISC-V Processor in 22nm FDSOI Technology. DCIS 2023: 1-6 - 2022
- [c15]Francesco Malena, Xavier Aragonès, Diego Mateo, Michele Caselli, Andrea Boni:
An Ultra Low-Voltage RF Front-end Receiver for IoT Devices. PRIME 2022: 161-164 - 2021
- [j9]Josep Altet, Enrique Barajas, Diego Mateo, Alexandre Billong, Xavier Aragonès, Xavier Perpiñà, Ferran Reverter:
BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits. Sensors 21(3): 805 (2021) - 2020
- [c14]Seyed Rasoul Aghazadeh, Herminio Martínez, Xavier Aragonès, Alireza Saberkari:
A 250-ps Integrated Ultra-Wideband Timed Array Beamforming Receiver in 0.18 μm CMOS. ICECS 2020: 1-4 - [c13]Rosana Rodríguez, Albert Crespo-Yepes, Javier Martín-Martínez, Montserrat Nafría, Xavier Aragonès, Diego Mateo, Enrique Barajas:
Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation. IRPS 2020: 1-7
2010 – 2019
- 2019
- [j8]Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Xavier Aragonès, Enrique Barajas, Diego Mateo, Francisco V. Fernández, Montserrat Nafría:
A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI. IEEE J. Solid State Circuits 54(2): 476-488 (2019) - [j7]Enrique Barajas, Xavier Aragonès, Diego Mateo, Josep Altet:
Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology. Sensors 19(21): 4815 (2019) - [c12]Xavier Aragonès, Alex Alvarez, Juan Pablo Rovayo, Josep Altet, Diego Mateo:
Design of ULV ULP LNAs Exploiting FBB in FDSOI 28nm Technology. DCIS 2019: 1-6 - [c11]Anant Rungta, Josep Altet, Enrique Barajas, Antonio Rubio, Xavier Aragonès, Diego Mateo:
On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits. DCIS 2019: 1-6 - [c10]Xavier Aragonès, Diego Mateo, Enrique Barajas, Albert Crespo-Yepes, Rosana Rodríguez, Javier Martín-Martínez, Montserrat Nafría:
Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling. ISCAS 2019: 1-5 - 2018
- [c9]Enrique Barajas, Xavier Aragonès, Diego Mateo, Francesc Moll, Antonio Rubio, Javier Martín-Martínez, Rosana Rodríguez, Marc Porti, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández:
Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology. PATMOS 2018: 82-87 - 2017
- [c8]Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Enrique Barajas, Xavier Aragonès, Diego Mateo:
A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging. SMACD 2017: 1-4 - 2014
- [c7]Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo:
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. MWSCAS 2014: 1081-1084 - 2013
- [j6]Marc Molina, Xavier Aragonès, Diego Mateo, José Luis González:
Inductor shielding strategies to protect mmW LC-VCOs from high frequency substrate noise. Microelectron. J. 44(5): 405-413 (2013) - 2012
- [j5]Juan F. Osorio, Xavier Aragonès:
Prediction of the impact of substrate coupled switching noise on frequency synthesizers. Microelectron. J. 43(3): 216-224 (2012) - 2010
- [c6]José Luis González, Xavier Aragonès, Marc Molina, Baudouin Martineau, Didier Belot:
A comparison between grounded and floating shield inductors for mmW VCOs. ESSCIRC 2010: 250-253
2000 – 2009
- 2009
- [c5]Marc Molina, Xavier Aragonès, José Luis González:
Experimental analysis of substrate isolation techniques for RF-SOC integration. SoCC 2009: 199-202 - 2008
- [c4]Laura Moreno, Didac Gómez, José Luis González, Diego Mateo, Xavier Aragonès, Roc Berenguer, Héctor Solar:
A low-power RF front-end for 2.5 GHz receivers. ISCAS 2008: 976-979 - 2005
- [c3]Miguel A. Méndez, Diego Mateo, Xavier Aragonès, José Luis González:
Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling. ESSCIRC 2005: 105-108 - 2004
- [j4]Luis Elvira, Ferran Martorell, Xavier Aragonès, José Luis González:
A physical-based noise macromodel for fast simulation of switching noise generation. Microelectron. J. 35(8): 677-684 (2004) - [c2]Luis Elvira, Ferran Martorell, Xavier Aragonès, José Luis González:
A Macromodelling Methodology for Efficient High-Level Simulation of Substrate Noise Generation. DATE 2004: 1362-1363 - 2003
- [c1]Ferran Martorell, Diego Mateo, Xavier Aragonès:
Modeling and Evaluation of Substrate Noise Induced by Interconnects. DATE 2003: 10524-10529 - 2002
- [j3]Xavier Aragonès, José Luis González, Francesc Moll, Antonio Rubio:
Noise Generation and Coupling Mechanisms in Deep-Submicron ICs. IEEE Des. Test Comput. 19(5): 27-35 (2002)
1990 – 1999
- 1999
- [j2]Xavier Aragonès, Antonio Rubio:
Experimental comparison of substrate noise coupling using different wafer types. IEEE J. Solid State Circuits 34(10): 1405-1409 (1999) - 1997
- [j1]Juan M. Casalta, Xavier Aragonès, Antonio Rubio:
Substrate coupling evaluation in BiCMOS technology. IEEE J. Solid State Circuits 32(4): 598-603 (1997)
Coauthor Index
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