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Doohwang Chang
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2020 – today
- 2021
- [c6]Ishaan Bassi, Sule Ozev, Doohwang Chang:
Maintaining NIST-Traceability for MEMS Sensors via In-Field Electrical Recalibration. VTS 2021: 1-7 - 2020
- [j3]Doohwang Chang
, Jennifer N. Kitchen
, Sayfe Kiaei, Sule Ozev
:
In-Field Recovery of RF Circuits from Wearout Based Performance Degradation. IEEE Trans. Emerg. Top. Comput. 8(2): 442-452 (2020)
2010 – 2019
- 2018
- [j2]Doohwang Chang, Ganapati Bhat, Ümit Y. Ogras
, Bertan Bakkaloglu
, Sule Ozev:
Detection Mechanisms for Unauthorized Wireless Transmissions. ACM Trans. Design Autom. Electr. Syst. 23(6): 70:1-70:21 (2018) - 2016
- [j1]Doohwang Chang, Jennifer N. Kitchen, Bertan Bakkaloglu
, Sayfe Kiaei, Sule Ozev:
Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits. IEEE Trans. Very Large Scale Integr. Syst. 24(3): 1179-1183 (2016) - [c5]Doohwang Chang, Jennifer Kitchen, Sule Ozev:
Post-production adaptation of RF circuits for application-specific performance metrics. ISCAS 2016: 2775-2778 - 2015
- [c4]Doohwang Chang, Bertan Bakkaloglu
, Sule Ozev:
Enabling unauthorized RF transmission below noise floor with no detectable impact on primary communication performance. VTS 2015: 1-4 - 2014
- [c3]Doohwang Chang, Sule Ozev, Ozgur Sinanoglu, Ramesh Karri
:
Approximating the age of RF/analog circuits through re-characterization and statistical estimation. DATE 2014: 1-4 - [c2]Doohwang Chang, Sule Ozev, Bertan Bakkaloglu
, Sayfe Kiaei, Engin Afacan, Günhan Dündar
:
Reliability enhancement using in-field monitoring and recovery for RF circuits. VTS 2014: 1-6 - 2011
- [c1]Ramachandran Venkatasubramanian, Doohwang Chang, Sule Ozev:
Analysis and Mitigation of Electromigration in RF Circuits: An LNA Case Study. ETS 2011: 215
Coauthor Index
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