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Takashi Mochiyama

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2000 – 2009

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2004
[c2]
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  dblp key:
  - conf/iccad/MaruyamaKMKSI04
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  persistent URL:
  - https://dblp.org/rec/conf/iccad/MaruyamaKMKSI04
Daisuke Maruyama, Akira Kanuma, Takashi Mochiyama, Hiroaki Komatsu, Yaroku Sugiyama, Noriyuki Ito:
Detection of multiple transitions in delay fault test of SPARC64 microprocessor. ICCAD 2004: 893-898
2003
[c1]
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  - conf/vts/HiraideBKIEYM03
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Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama:
BIST-Aided Scan Test - A New Method for Test Cost Reduction. VTS 2003: 359-364

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