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V. M. Girault

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2010
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Ramun M. Kho, A. J. Moonen, V. M. Girault, Jaap Bisschop, E. H. T. Olthof, S. Nath, Z. N. Liang:
Determination of the stress level for voltage screen of integrated circuits. Microelectron. Reliab. 50(9-11): 1210-1214 (2010)

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