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2000 – 2009
- 2006
[j2]Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Seiji Kajihara:
A Statistical Quality Model for Delay Testing. IEICE Trans. Electron. 89-C(3): 349-355 (2006)- [c8]Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato:
A dynamic test compaction procedure for high-quality path delay testing. ASP-DAC 2006: 348-353 - [c7]Xijiang Lin, Kun-Han Tsai, Chen Wang, Mark Kassab, Janusz Rajski, Takeo Kobayashi, Randy Klingenberg, Yasuo Sato, Shuji Hamada, Takashi Aikyo:
Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects. ATS 2006: 139-146 - [c6]Anis Uzzaman, Mick Tegethoff, Bibo Li, Kevin McCauley, Shuji Hamada, Yasuo Sato:
Not all Delay Tests Are the Same - SDQL Model Shows True-Time. ATS 2006: 147-152 - [c5]Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Yasuyuki Noduyama, Yasuo Sato:
Recognition of Sensitized Longest Paths in Transition Delay Test. ITC 2006: 1-6 - [c4]Seiji Kajihara, Shohei Morishima, Akane Takuma, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato:
A Framework of High-quality Transition Fault ATPG for Scan Circuits. ITC 2006: 1-6 - 2005
- [c3]Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Seiji Kajihara:
Evaluation of the statistical delay quality model. ASP-DAC 2005: 305-310 - [c2]Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato:
Path delay test compaction with process variation tolerance. DAC 2005: 845-850 - [c1]Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Atsuo Takatori, Yasuyuki Nozuyama, Seiji Kajihara:
Invisible delay quality - SDQM model lights up what could not be seen. ITC 2005: 9
1990 – 1999
- 1991
- [j1]Teruhiko Yamada, Shuji Hamada, Tatsuo Matsumoto, Toshihiko Takahashi, Takao Nakayama:
Method of diagnosing multiple stuck-at-faults in combinational circuits. Syst. Comput. Jpn. 22(11): 21-30 (1991)
Coauthor Index
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