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Emile Y. Sahouria

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2000 – 2009

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2000
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Valery Axelrad, Nicolas B. Cobb, M. O'Brien, Thuy Do, Tom Donnelly, Yuri Granik, Emile Y. Sahouria, Victor Boksha, Artur Balasinski:
Efficient Full-Chip Yield Analysis Methodology for OPC-Corrected VLSI Designs. ISQED 2000: 461-466

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