BibTeX records: Xavier Gagnard

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@inproceedings{DBLP:conf/3dic/HenryCCCNBVSBGS09,
  author    = {David Henry and
               S{\'{e}}verine Cheramy and
               Jean Charbonnier and
               Pascal Chausse and
               Muriel Neyret and
               Cathy Brunet{-}Manquat and
               Sophie Verrun and
               Nicolas Sillon and
               Laurent Bonnot and
               Xavier Gagnard and
               E. Saugier},
  title     = {3D integration technology for set-top box application},
  booktitle = {{IEEE} International Conference on 3D System Integration, 3DIC 2009,
               San Francisco, California, USA, 28-30 September 2009},
  pages     = {1--7},
  publisher = {{IEEE}},
  year      = {2009},
  url       = {https://doi.org/10.1109/3DIC.2009.5306561},
  doi       = {10.1109/3DIC.2009.5306561},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/conf/3dic/HenryCCCNBVSBGS09.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CarvouBSRBRGR02,
  author    = {E. Carvou and
               F. Le Bihan and
               Anne Claire Sala{\"{u}}n and
               R. Rogel and
               Olivier Bonnaud and
               Yannick Rey{-}Tauriac and
               Xavier Gagnard and
               L. Roland},
  title     = {Reliability improvement of high value doped polysilicon-based resistors},
  journal   = {Microelectron. Reliab.},
  volume    = {42},
  number    = {9-11},
  pages     = {1369--1372},
  year      = {2002},
  url       = {https://doi.org/10.1016/S0026-2714(02)00151-8},
  doi       = {10.1016/S0026-2714(02)00151-8},
  timestamp = {Fri, 25 Sep 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/mr/CarvouBSRBRGR02.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GagnardRB01,
  author    = {Xavier Gagnard and
               Yannick Rey{-}Tauriac and
               Olivier Bonnaud},
  title     = {Polysilicon oxide quality optimization at Wafer level of a Bipolar/CMOS/DMOS
               technology},
  journal   = {Microelectron. Reliab.},
  volume    = {41},
  number    = {9-10},
  pages     = {1335--1340},
  year      = {2001},
  url       = {https://doi.org/10.1016/S0026-2714(01)00213-X},
  doi       = {10.1016/S0026-2714(01)00213-X},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/GagnardRB01.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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