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2020 – today
- 2022
[c32]Artem Glukhov, Valerio Milo, Andrea Baroni
, Nicola Lepri, Cristian Zambelli, Piero Olivo, Eduardo Pérez, Christian Wenger, Daniele Ielmini:
Statistical model of program/verify algorithms in resistive-switching memories for in-memory neural network accelerators. IRPS 2022: 3- [c31]Piergiulio Mannocci, Andrea Baroni, Enrico Melacarne, Cristian Zambelli, Piero Olivo, Eduardo Pérez, Christian Wenger, Daniele Ielmini:
Experimental verification and benchmark of in-memory principal component analysis by crosspoint arrays of resistive switching memory. ISCAS 2022: 326-330 - [c30]Artem Glukhov, Nicola Lepri, Valerio Milo, Andrea Baroni, Cristian Zambelli, Piero Olivo, Eduardo Pérez, Christian Wenger, Daniele Ielmini:
End-to-end modeling of variability-aware neural networks based on resistive-switching memory arrays. VLSI-SoC 2022: 1-5 - 2021
- [c29]Valerio Milo, Francesco Anzalone, Cristian Zambelli, Eduardo Pérez, Mamathamba Kalishettyhalli Mahadevaiah, Oscar Gonzalez Ossorio, Piero Olivo, Christian Wenger, Daniele Ielmini:
Optimized programming algorithms for multilevel RRAM in hardware neural networks. IRPS 2021: 1-6
2010 – 2019
- 2019
- [j34]Cristian Zambelli, Riccardo Bertaggia, Lorenzo Zuolo, Rino Micheloni, Piero Olivo:
Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD. IEEE Trans. Circuits Syst. II Express Briefs 66-II(10): 1738-1742 (2019) - [j33]Lorenzo Zuolo, Cristian Zambelli, Alessia Marelli, Rino Micheloni, Piero Olivo:
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives. IEEE Trans. Emerg. Top. Comput. 7(3): 507-515 (2019) - [c28]Valerio Milo, Cristian Zambelli, Piero Olivo, Eduardo Pérez, Oscar Gonzalez Ossorio, Christian Wenger, Daniele Ielmini:
Low-energy inference machine with multilevel HfO2 RRAM arrays. ESSDERC 2019: 174-177 - [c27]Mamathamba Kalishettyhalli Mahadevaiah, Eduardo Pérez, Christian Wenger, Alessandro Grossi, Cristian Zambelli, Piero Olivo, Finn Zahari, Hermann Kohlstedt, Martin Ziegler:
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing. IRPS 2019: 1-4 - 2018
- [j32]Francesco Pieri, Cristian Zambelli, Andrea Nannini, Piero Olivo, Sergio Saponara:
Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage. IEEE Consumer Electron. Mag. 7(5): 8-17 (2018) - [j31]Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Christian Wenger, Jérémy Alvarez-Herault, Ken Mackay:
An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays. IEEE Trans. Emerg. Top. Comput. 6(2): 269-277 (2018) - [j30]Alessandro Grossi, Elisa Vianello, Cristian Zambelli, Pablo Royer, Jean-Philippe Noel, Bastien Giraud, Luca Perniola, Piero Olivo, Etienne Nowak:
Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM. IEEE Trans. Very Large Scale Integr. Syst. 26(12): 2599-2607 (2018) - [c26]Cristian Zambelli, Marco Castellari, Piero Olivo, Davide Bertozzi:
Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs. NGCAS 2018: 21-24 - 2017
- [j29]Rino Micheloni, Luca Crippa, Cristian Zambelli, Piero Olivo:
Architectural and Integration Options for 3D NAND Flash Memories. Comput. 6(3): 27 (2017) - [j28]Rino Micheloni, Piero Olivo:
Solid-State Drives (SSDs) [Scanning the Issue]. Proc. IEEE 105(9): 1586-1588 (2017) - [j27]Lorenzo Zuolo, Cristian Zambelli, Rino Micheloni, Piero Olivo:
Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance. Proc. IEEE 105(9): 1589-1608 (2017) - 2016
- [p1]Alessandro Grossi, Cristian Zambelli, Piero Olivo:
Reliability of 3D NAND Flash Memories. 3D Flash Memories 2016: 29-62 - 2015
- [j26]Lorenzo Zuolo, Cristian Zambelli, Rino Micheloni, Marco Indaco, Stefano Di Carlo, Paolo Prinetto, Davide Bertozzi, Piero Olivo:
SSDExplorer: A Virtual Platform for Performance/Reliability-Oriented Fine-Grained Design Space Exploration of Solid State Drives. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(10): 1627-1638 (2015) - [j25]Davide Bertozzi, Stefano Di Carlo, Salvatore Galfano, Marco Indaco, Piero Olivo, Paolo Prinetto, Cristian Zambelli:
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers. ACM Trans. Embed. Comput. Syst. 14(1): 7:1-7:24 (2015) - [c25]Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Jérémy Alvarez-Herault, Ken Mackay:
Automated characterization of TAS-MRAM test arrays. DTIS 2015: 1-2 - [c24]Cristian Zambelli, Alessandro Grossi, Piero Olivo, Christian Walczyk, Christian Wenger:
RRAM Reliability/Performance Characterization through Array Architectures Investigations. ISVLSI 2015: 327-332 - [c23]Alessandro Grossi, Cristian Zambelli, Piero Olivo, Jérémy Alvarez-Herault, Ken Mackay:
Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions. NVMTS 2015: 1-4 - [c22]Lorenzo Zuolo, Cristian Zambelli, Rino Micheloni, Stephen Bates, Piero Olivo:
Design space exploration of latency and bandwidth in RRAM-based solid state drives. NVMTS 2015: 1-4 - 2014
- [j24]Stefano Di Carlo, Salvatore Galfano, Marco Indaco, Paolo Prinetto, Davide Bertozzi, Piero Olivo, Cristian Zambelli:
FLARES: An Aging Aware Algorithm to Autonomously Adapt the Error Correction Capability in NAND Flash Memories. ACM Trans. Archit. Code Optim. 11(3): 26:1-26:25 (2014) - [c21]Lorenzo Zuolo, Cristian Zambelli, Rino Micheloni, Salvatore Galfano, Marco Indaco, Stefano Di Carlo, Paolo Prinetto, Piero Olivo, Davide Bertozzi:
SSDExplorer: A virtual platform for fine-grained design space exploration of Solid State Drives. DATE 2014: 1-6 - 2013
- [c20]Lorenzo Zuolo, Gabriele Miorandi, Cristian Zambelli, Piero Olivo, Davide Bertozzi:
System interconnect extensions for fully transparent demand paging in low-cost MMU-less embedded systems. ISSoC 2013: 1-6 - 2012
- [j23]Cristian Zambelli, Andrea Chimenton, Piero Olivo:
Modeling of SET seasoning effects in Phase Change Memory arrays. Microelectron. Reliab. 52(6): 1060-1064 (2012) - [c19]Cristian Zambelli, Marco Indaco, Michele Fabiano, Stefano Di Carlo, Paolo Prinetto, Piero Olivo, Davide Bertozzi:
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories. DATE 2012: 881-886 - 2011
- [j22]Cristian Zambelli, Davide Bertozzi, Andrea Chimenton, Piero Olivo:
Nonvolatile Memory Partitioning Scheme for Technology-Based Performance-Reliability Tradeoff. IEEE Embed. Syst. Lett. 3(1): 13-15 (2011)
2000 – 2009
- 2006
- [j21]Andrea Chimenton, Fernanda Irrera, Piero Olivo:
Improving performance and reliability of NOR-Flash arrays by using pulsed operation. Microelectron. Reliab. 46(9-11): 1478-1481 (2006) - 2005
- [j20]Andrea Chimenton, Piero Olivo:
Reliability of erasing operation in NOR-Flash memories. Microelectron. Reliab. 45(7-8): 1094-1108 (2005) - 2003
- [j19]Andrea Chimenton, Paolo Pellati, Piero Olivo:
Overerase phenomena: an insight into flash memory reliability. Proc. IEEE 91(4): 617-626 (2003) - 2001
- [j18]Paolo Pellati, Piero Olivo:
Automated test equipment for research on nonvolatile memories. IEEE Trans. Instrum. Meas. 50(5): 1162-1166 (2001)
1990 – 1999
- 1998
- [j17]Piero Olivo, Marcello Dalpasso:
A Bist Scheme for Non-Volatile Memories. J. Electron. Test. 12(1-2): 139-144 (1998) - 1997
- [j16]Paolo Pavan, Roberto Bez, Piero Olivo, Enrico Zanoni:
Flash memory cells-an overview. Proc. IEEE 85(8): 1248-1271 (1997) - [j15]Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò:
On-line detection of bridging and delay faults in functional blocks of CMOS self-checking circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(7): 770-776 (1997) - 1996
- [j14]Michele Favalli, Marcello Dalpasso, Piero Olivo:
Modeling and simulation of broken connections in CMOS IC's. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(7): 808-814 (1996) - [c18]Piero Olivo, Marcello Dalpasso:
Self-Learning Signature Analysis for Non-Volatile Memory Testing. ITC 1996: 303-308 - 1995
- [j13]Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò:
Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults. J. Electron. Test. 6(1): 7-22 (1995) - [c17]Marcello Dalpasso, Michele Favalli, Piero Olivo:
Correlation between IDDQ testing quality and sensor accuracy. ED&TC 1995: 568-572 - [c16]Alessandro Bogliolo, Maurizio Damiani, Piero Olivo, Bruno Riccò:
Reliability evaluation of combinational logic circuits by symbolic simulation. VTS 1995: 235-243 - [c15]Marcello Dalpasso, Michele Favalli, Piero Olivo:
Test pattern generation for IDDQ: increasing test quality. VTS 1995: 304-309 - 1994
- [c14]Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò:
Modeling of Broken Connections Faults in CMOS ICs. EDAC-ETC-EUROASIC 1994: 159-164 - 1993
- [j12]Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò:
Fault simulation of parametric bridging faults in CMOS IC's. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(9): 1403-1410 (1993) - [j11]Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò:
Analysis of resistive bridging fault detection in BiCMOS digital ICs. IEEE Trans. Very Large Scale Integr. Syst. 1(3): 342-355 (1993) - [c13]Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò:
Design Rules for CMOS Self Checking Circuits with Parametric Faults in the Functional Block. DFT 1993: 271-278 - [c12]Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò:
A Highly Testable 1-out-of-3 CMOS Checker. DFT 1993: 279-286 - [c11]Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò:
Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs. ITC 1993: 865-874 - 1992
- [j10]Michele Favalli, Piero Olivo, Bruno Riccò:
Dynamic effects in the detection of bridging faults in CMOS ICs. J. Electron. Test. 3(3): 197-205 (1992) - [j9]Silvia Ercolani, Michele Favalli, Maurizio Damiani, Piero Olivo, Bruno Riccò:
Testability measures in pseudorandom testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(6): 794-800 (1992) - [j8]Michele Favalli, Piero Olivo, Bruno Riccò:
A probabilistic fault model for 'analog' faults in digital CMOS circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(11): 1459-1462 (1992) - [c10]Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò:
Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs. ITC 1992: 466-475 - [c9]Marcello Dalpasso, Michele Favalli, Piero Olivo, Bruno Riccò:
Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs. ITC 1992: 486-495 - [c8]Cecilia Metra, Michele Favalli, Piero Olivo, Bruno Riccò:
CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults. ITC 1992: 948-957 - 1991
- [j7]Michele Favalli, Piero Olivo, Bruno Riccò, Fabio Somenzi:
Fault simulation for general FCMOS ICs. J. Electron. Test. 2(2): 181-190 (1991) - [j6]Maurizio Damiani, Piero Olivo, Bruno Riccò:
Analysis and Design of Linear Finite State Machines for Signature Analysis Testing. IEEE Trans. Computers 40(9): 1034-1045 (1991) - [j5]Michele Favalli, Piero Olivo, Bruno Riccò:
A novel critical path heuristic for fast fault grading. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(4): 544-548 (1991) - [j4]Michele Favalli, Piero Olivo, Maurizio Damiani, Bruno Riccò:
Fault simulation of unconventional faults in CMOS circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(5): 677-682 (1991) - [c7]M. Ambanelli, Michele Favalli, Piero Olivo, Bruno Riccò:
Detection of PLA multiple crosspoint faults. EURO-DAC 1991: 80-84 - [c6]Michele Favalli, Piero Olivo, Bruno Riccò:
A probabilistic fault model for analog faults. EURO-DAC 1991: 85-88 - 1990
- [j3]Massimo Lanzoni, Roberto Menozzi, Piero Olivo, Bruno Riccò, Andrea Haardt:
Testing of E2PROM aging and endurance: A case study. Eur. Trans. Telecommun. 1(2): 201-207 (1990) - [j2]Maurizio Damiani, Piero Olivo, Michele Favalli, Silvia Ercolani, Bruno Riccò:
Aliasing in signature analysis testing with multiple input shift registers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(12): 1344-1353 (1990)
1980 – 1989
- 1989
- [j1]Maurizio Damiani, Piero Olivo, Michele Favalli, Bruno Riccò:
An analytical model for the aliasing probability in signature analysis testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(11): 1133-1144 (1989) - [c5]Silvia Ercolani, Michele Favalli, Maurizio Damiani, Piero Olivo, Bruno Riccò:
Improved testability evaluations in combinational logic networks. ICCD 1989: 352-355 - [c4]Massimo Lanzoni, Piero Olivo, Bruno Riccò:
A Testing Technique to Characterize E^2PROM's Aging and Endurance. ITC 1989: 391-396 - [c3]Michele Favalli, Piero Olivo, Maurizio Damiani, Bruno Riccò:
CMOS Design for Improved IC Testability. ITC 1989: 934 - [c2]Piero Olivo, Maurizio Damiani, Bruno Riccò:
On the Design of Multiple-Input Shift-Registers for Signature Analysis Testing. ITC 1989: 936 - 1988
- [c1]Maurizio Damiani, Piero Olivo, Michele Favalli, Bruno Riccò:
Aliasing errors in signature analysis testing of integrated circuits. ICCD 1988: 458-461
Coauthor Index
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