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Baojun Liu

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This is just a disambiguation page, and is not intended to be the bibliography of an actual person. The links to all actual bibliographies of persons of the same or a similar name can be found below. Any publication listed on this page has not been assigned to an actual author yet. If you know the true author of one of the publications listed below, you are welcome to contact us.

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2020 – today

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2025
[j9]
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Wenyu Ma, Xiaobo Bai, Baojun Liu, Yaqing Yu, Yu Zhu:
Dense correspondence relationships of 3D facial models under a global and local fitting framework. Vis. Comput. 41(13): 11083-11101 (2025)
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Shuhan Zhang, Shuai Wang, Li Chen, Dan Li, Baojun Liu:
Your Shield is My Sword: A Persistent Denial-of-Service Attack via the Reuse of Unvalidated Caches in DNSSEC Validation. USENIX Security Symposium 2025: 3517-3535
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Yunyi Zhang, Shibo Cui, Baojun Liu, Jingkai Yu, Min Zhang, Fan Shi, Han Zheng:
Beyond Jailbreak: Unveiling Risks in LLM Applications Arising from Blurred Capability Boundaries. CoRR abs/2511.17874 (2025)
2024
[j8]
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Baojun Liu, Zimin Wang:
Research on human behaviour recognition method of sports images based on machine learning. Int. J. Bio Inspired Comput. 23(2): 99-110 (2024)
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Baojun Liu, Jinhui Yuan, Chao Mei:
Optimal Few-Mode Self-Similar Pulse Compression in Photonic Crystal Fibers. CSNDSP 2024: 277-279
2021
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Baojun Liu:
Research on NPE Algorithm of Ring Main Unit Fault Detection Based on Internet of Things Technology. ICGEC 2021: 669-678
2020
[j7]
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Zhongxun Wang, Baojun Liu, Min Zhang, Yang Lou:
Research on encoding and decoding algorithms of non-binary LDPC code and FPGA implementation. J. Comput. Methods Sci. Eng. 20(1): 167-175 (2020)

2010 – 2019

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2019
[j6]
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Xiaoqiang Liu, Li Cai, Baojun Liu, Xiaokuo Yang, Huanqing Cui, Cheng Li:
Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing. IEEE Access 7: 51276-51283 (2019)
2015
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Baojun Liu, Li Cai, Yan Li, Qiang Kang:
Reliability for nanomagnetic logic (NML) readout circuit under single event effect. Microelectron. J. 46(1): 20-26 (2015)
2014
[j4]
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Baojun Liu, Li Cai, Jing Zhu, Qiang Kang, Mingliang Zhang, Xiangye Chen:
On-chip readout circuit for nanomagnetic logic. IET Circuits Devices Syst. 8(1): 65-72 (2014)
2012
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Baojun Liu, Li Cai, Xiaokuo Yang, Hongtu Huang, Peng Bai, Weidong Peng:
The impact of Miller and coupling effects on single event transient in logical circuits. Microelectron. J. 43(1): 63-68 (2012)
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Baojun Liu, Li Cai, Peng Bai, Weidong Peng:
Reliability evaluation for single event crosstalk via probabilistic transfer matrix. Microelectron. Reliab. 52(7): 1511-1514 (2012)
[j1]
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Baojun Liu, Li Cai:
Reliability Evaluation for Single Event Transients on Digital Circuits. IEEE Trans. Reliab. 61(3): 687-691 (2012)

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