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2020 – today
- 2024
[c9]Jaehyeok Yang, Hyeongjun Ko, Kyunghoon Kim, Hyunsu Park, Jihwan Park, Ji-Hyo Kang, Jin-Youp Cha, Seongjin Kim, Youngtaek Kim, Minsoo Park, Gangsik Lee, Keonho Lee, Sanghoon Lee, Gyunam Jeon, Sera Jeong, Yongsuk Joo, Jaehoon Cha, Seonwoo Hwang, Boram Kim, Sang-Yeon Byeon, Sungkwon Lee, Hyeonyeol Park, Joohwan Cho, Jonghwan Kim:
13.1 A 35.4Gb/s/pin 16Gb GDDR7 with a Low-Power Clocking Architecture and PAM3 IO Circuitry. ISSCC 2024: 232-234- [c8]Taegeon Um, Byungsoo Oh, Minyoung Kang, Woo-Yeon Lee, Goeun Kim, Dongseob Kim, Youngtaek Kim, Mohd Muzzammil, Myeongjae Jeon:
Metis: Fast Automatic Distributed Training on Heterogeneous GPUs. USENIX ATC 2024: 563-578 - 2022
- [j4]Jihyo Kang
, Jaehyeok Yang, Kyunghoon Kim, Joo-Hyung Chae, Gang-Sik Lee, Sang-Yeon Byeon, Boram Kim, Dong-Hyun Kim, Youngtaek Kim, Yeongmuk Cho, Junghwan Ji, Sera Jeong, Jaehoon Cha, Minsoo Park, Hongdeuk Kim, Sijun Park, Sunho Kim, Hae-Kang Jung, Jieun Jang, Sangkwon Lee, Hyungsoo Kim, Joo-Hwan Cho, Junhyun Chun, Seon-Yong Cha:
A 24-Gb/s/Pin 8-Gb GDDR6 With a Half-Rate Daisy-Chain-Based Clocking Architecture and I/O Circuitry for Low-Noise Operation. IEEE J. Solid State Circuits 57(1): 212-223 (2022) - [j3]Hyeon Jeon, Hyung-Kwon Ko, Jaemin Jo, Youngtaek Kim, Jinwook Seo:
Measuring and Explaining the Inter-Cluster Reliability of Multidimensional Projections. IEEE Trans. Vis. Comput. Graph. 28(1): 551-561 (2022) - [c7]Sebeom Park, Soohyun Lee, Youngtaek Kim, Hyeon Jeon, Seokweon Jung, Jinwook Bok, Jinwook Seo:
VANT: A Visual Analytics System for Refining Parallel Corpora in Neural Machine Translation. PacificVis 2022: 181-185 - [i4]Hyeon Jeon, Michaël J. Aupetit, Soohyun Lee, Hyung-Kwon Ko, Youngtaek Kim, Jinwook Seo:
Distortion-Aware Brushing for Interactive Cluster Analysis in Multidimensional Projections. CoRR abs/2201.06379 (2022) - 2021
- [j2]Youngtaek Kim, Jaeyoung Kim, Hyeon Jeon, Young-Ho Kim, Hyunjoo Song, Bo Hyoung Kim, Jinwook Seo:
Githru: Visual Analytics for Understanding Software Development History Through Git Metadata Analysis. IEEE Trans. Vis. Comput. Graph. 27(2): 656-666 (2021) - [c6]Youngtaek Kim, Hyeon Jeon, Young-Ho Kim, Yuhoon Ki, Hyunjoo Song, Jinwook Seo:
Visualization Support for Multi-criteria Decision Making in Software Issue Propagation. PacificVis 2021: 81-85 - [c5]Seokweon Jung, Kiroong Choe, Seokhyeon Park, Hyung-Kwon Ko, Youngtaek Kim, Jinwook Seo:
Mixed-Initiative Approach to Extract Data from Pictures of Medical Invoice. PacificVis 2021: 111-115 - [c4]Kyunghoon Kim, Joo-Hyung Chae, Jaehyeok Yang, Jihyo Kang, Gang-Sik Lee, Sang-Yeon Byeon, Youngtaek Kim, Boram Kim, Dong-Hyun Kim, Yeongmuk Cho, Kangmoo Choi, Hyeongyeol Park, Junghwan Ji, Sera Jeong, Yongsuk Joo, Jaehoon Cha, Minsoo Park, Hongdeuk Kim, Sijun Park, Kyubong Kong, Sunho Kim, Sangkwon Lee, Junhyun Chun, Hyungsoo Kim, Seon-Yong Cha:
A 24Gb/s/pin 8Gb GDDR6 with a Half-Rate Daisy-Chain-Based Clocking Architecture and IO Circuitry for Low-Noise Operation. ISSCC 2021: 344-346 - [i3]Youngtaek Kim, Hyeon Jeon, Kiroong Choe, Hyunjoo Song, Bo Hyoung Kim, Jinwook Seo:
Interactive Visualization for Exploring Information Fragments in Software Repositories. CoRR abs/2104.13568 (2021) - [i2]Hyeon Jeon, Hyung-Kwon Ko, Jaemin Jo, Youngtaek Kim, Jinwook Seo:
Measuring and Explaining the Inter-Cluster Reliability of Multidimensional Projections. CoRR abs/2107.07859 (2021) - 2020
- [i1]Youngtaek Kim, Jaeyoung Kim, Hyeon Jeon, Young-Ho Kim, Hyunjoo Song, Bo Hyoung Kim, Jinwook Seo:
Githru: Visual Analytics for Understanding Software Development History Through Git Metadata Analysis. CoRR abs/2009.03115 (2020)
2010 – 2019
- 2013
- [j1]Youngtaek Kim, Lizy Kurian John, Sanjay Pant, Srilatha Manne, Michael J. Schulte, William Lloyd Bircher, Madhu Saravana Sibi Govindan:
Automating Stressmark Generation for Testing Processor Voltage Fluctuations. IEEE Micro 33(4): 66-75 (2013) - [c3]Youngtaek Kim, Lizy Kurian John, Indrani Paul, Srilatha Manne, Michael J. Schulte:
Performance boosting under reliability and power constraints. ICCAD 2013: 334-341 - 2012
- [c2]Youngtaek Kim, Lizy Kurian John, Sanjay Pant, Srilatha Manne, Michael J. Schulte, William Lloyd Bircher, Madhu Saravana Sibi Govindan:
AUDIT: Stress Testing the Automatic Way. MICRO 2012: 212-223 - 2011
- [c1]Youngtaek Kim, Lizy Kurian John:
Automated di/dt stressmark generation for microprocessor power delivery networks. ISLPED 2011: 253-258
Coauthor Index
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