A BIST Approach to On-Line Monitoring of Digital VLSI Circuits: A CAD Tool.

Thu, 01 Jan 2004 00:00:00 +0100

Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra:
A BIST Approach to On-Line Monitoring of Digital VLSI Circuits: A CAD Tool. Asian Test Symposium 2004: 184-189