Test Methodologies in the Deep Submicron Era - Analog, Mixed-Signal, and RF.

Sat, 01 Jan 2005 00:00:00 +0100

Abhijit Chatterjee, Ali Keshavarzi, Amit Patra, Siddhartha Mukhopadhyay:
Test Methodologies in the Deep Submicron Era - Analog, Mixed-Signal, and RF. VLSI Design 2005: 12-13