Unified Technique for on-Line Testing of Digital Circuits: Delay and Stuck-at Fault Models.

Tue, 01 Jan 2008 00:00:00 +0100

Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra, Dipankar Sarkar:
Unified Technique for on-Line Testing of Digital Circuits: Delay and Stuck-at Fault Models. J. Circuits Syst. Comput. 17(6): 1069-1089 (2008)