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Joost Melai

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2020 – today

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2023
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Joost Melai, V. Subramanian, I. Pouwel:
Impact of Process Variation on MIM Capacitor Lifetime. IRPS 2023: 1-4

2000 – 2009

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2008
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Cora Salm, Victor M. Blanco Carballo, Joost Melai, Jurriaan Schmitz:
Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip. Microelectron. Reliab. 48(8-9): 1139-1143 (2008)

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