![](https://dblp.dagstuhl.de/img/logo.ua.320x120.png)
![](https://dblp.dagstuhl.de/img/dropdown.dark.16x16.png)
![](https://dblp.dagstuhl.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.dagstuhl.de/img/search.dark.16x16.png)
![search dblp](https://dblp.dagstuhl.de/img/search.dark.16x16.png)
default search action
Sybille Hellebrand
Person information
Refine list
![note](https://dblp.dagstuhl.de/img/note-mark.dark.12x12.png)
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2024
- [j21]Somayeh Sadeghi Kohan
, Sybille Hellebrand
, Hans-Joachim Wunderlich
:
Workload-Aware Periodic Interconnect BIST. IEEE Des. Test 41(4): 50-55 (2024) - [c57]Hanieh Jafarzadeh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich:
Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations. ETS 2024: 1-6 - [c56]Hanieh Jafarzadeh, Florian Klemme, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich:
Vmin Testing under Variations: Defect vs. Fault Coverage. LATS 2024: 1-6 - 2023
- [c55]Somayeh Sadeghi Kohan, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich:
Optimizing the Streaming of Sensor Data with Approximate Communication. ATS 2023: 1-6 - [c54]Somayeh Sadeghi Kohan, Sybille Hellebrand, Hans-Joachim Wunderlich:
Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication. DSN-W 2023: 203-206 - [c53]Abdalrhman Badran, Somayeh Sadeghi Kohan, Jan Dennis Reimer, Sybille Hellebrand:
Approximate Communication: Balancing Performance, Power, Reliability, and Safety. ETS 2023: 1-6 - [c52]Hanieh Jafarzadeh, Florian Klemme, Jan Dennis Reimer, Zahra Paria Najafi-Haghi, Hussam Amrouch, Sybille Hellebrand, Hans-Joachim Wunderlich:
Robust Pattern Generation for Small Delay Faults Under Process Variations. ITC 2023: 111-116 - 2021
- [j20]Somayeh Sadeghi Kohan, Sybille Hellebrand, Hans-Joachim Wunderlich:
Stress-Aware Periodic Test of Interconnects. J. Electron. Test. 37(5): 715-728 (2021) - 2020
- [c51]Alexander Sprenger
, Somayeh Sadeghi Kohan, Jan Dennis Reimer, Sybille Hellebrand:
Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study. DFT 2020: 1-6 - [c50]Stefan Holst, Matthias Kampmann
, Alexander Sprenger
, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, Xiaoqing Wen:
Logic Fault Diagnosis of Hidden Delay Defects. ITC 2020: 1-10 - [c49]Somayeh Sadeghi Kohan, Sybille Hellebrand:
Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects. VTS 2020: 1-6
2010 – 2019
- 2019
- [j19]Alexander Sprenger
, Sybille Hellebrand:
Divide and Compact - Stochastic Space Compaction for Faster-than-at-Speed Test. J. Circuits Syst. Comput. 28(Supplement-1): 1940001:1-1940001:23 (2019) - [j18]Matthias Kampmann
, Michael A. Kochte
, Chang Liu
, Eric Schneider
, Sybille Hellebrand
, Hans-Joachim Wunderlich
:
Built-In Test for Hidden Delay Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(10): 1956-1968 (2019) - [c48]Mohammad Urf Maaz, Alexander Sprenger
, Sybille Hellebrand:
A Hybrid Space Compactor for Adaptive X-Handling. ITC 2019: 1-8 - 2018
- [j17]Sybille Hellebrand, Jörg Henkel, Anand Raghunathan
, Hans-Joachim Wunderlich:
Guest Editors' Introduction. IEEE Embed. Syst. Lett. 10(1): 1 (2018) - [j16]Matthias Kampmann
, Sybille Hellebrand
:
Design for Small Delay Test - A Simulation Study. Microelectron. Reliab. 80: 124-133 (2018) - [c47]Chang Liu, Eric Schneider, Matthias Kampmann
, Sybille Hellebrand, Hans-Joachim Wunderlich:
Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. ATS 2018: 92-97 - [c46]Alexander Sprenger
, Sybille Hellebrand:
Tuning Stochastic Space Compaction to Faster-than-at-Speed Test. DDECS 2018: 73-78 - 2017
- [c45]Matthias Kampmann
, Sybille Hellebrand:
Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. DDECS 2017: 35-41 - [c44]Maria K. Michael, Rolf Drechsler
, Stephan Eggersglüß, Haralampos-G. D. Stratigopoulos, Sybille Hellebrand, Rob Aitken:
Foreword. ETS 2017: 1-2 - [c43]Jyotirmoy V. Deshmukh, Wolfgang Kunz, Hans-Joachim Wunderlich, Sybille Hellebrand:
Special session on early life failures. VTS 2017: 1 - 2016
- [c42]Matthias Kampmann
, Sybille Hellebrand:
X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. ATS 2016: 1-6 - 2015
- [j15]Zhengfeng Huang, Huaguo Liang, Sybille Hellebrand:
A High Performance SEU Tolerant Latch. J. Electron. Test. 31(4): 349-359 (2015) - [c41]Matthias Kampmann
, Michael A. Kochte, Eric Schneider, Thomas Indlekofer, Sybille Hellebrand, Hans-Joachim Wunderlich:
Optimized Selection of Frequencies for Faster-Than-at-Speed Test. ATS 2015: 109-114 - 2014
- [j14]Laura Rodríguez Gómez, Alejandro Cook, Thomas Indlekofer, Sybille Hellebrand, Hans-Joachim Wunderlich:
Adaptive Bayesian Diagnosis of Intermittent Faults. J. Electron. Test. 30(5): 527-540 (2014) - [j13]Sybille Hellebrand, Hans-Joachim Wunderlich:
SAT-based ATPG beyond stuck-at fault testing. it Inf. Technol. 56(4): 165-172 (2014) - [c40]Sybille Hellebrand, Thomas Indlekofer, Matthias Kampmann
, Michael A. Kochte, Chang Liu, Hans-Joachim Wunderlich:
FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects. ITC 2014: 1-8 - 2013
- [c39]Sybille Hellebrand:
Analyzing and quantifying fault tolerance properties. LATW 2013: 1 - 2012
- [c38]Alejandro Cook, Sybille Hellebrand, Hans-Joachim Wunderlich:
Built-in self-diagnosis exploiting strong diagnostic windows in mixed-mode test. ETS 2012: 1-6 - [c37]Alejandro Cook, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, Hans-Joachim Wunderlich:
Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test. LATW 2012: 1-4 - 2011
- [j12]Fabian Hopsch, Bernd Becker
, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich:
Variation-aware fault modeling. Sci. China Inf. Sci. 54(9): 1813-1826 (2011) - [c36]Alejandro Cook, Sybille Hellebrand, Thomas Indlekofer, Hans-Joachim Wunderlich:
Diagnostic Test of Robust Circuits. Asian Test Symposium 2011: 285-290 - [c35]Ilia Polian, Bernd Becker
, Sybille Hellebrand, Hans-Joachim Wunderlich, Peter C. Maxwell:
Towards Variation-Aware Test Methods. ETS 2011: 219-225 - 2010
- [j11]Sybille Hellebrand:
Nano-electronic Systems (Nano-elektronische Systeme). it Inf. Technol. 52(4): 179-180 (2010) - [c34]Fabian Hopsch, Bernd Becker
, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich:
Variation-Aware Fault Modeling. Asian Test Symposium 2010: 87-93 - [c33]Marc Hunger, Sybille Hellebrand:
The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. DFT 2010: 101-108 - [c32]Bernd Becker
, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich:
Massive statistical process variations: A grand challenge for testing nanoelectronic circuits. DSN Workshops 2010: 95-100 - [c31]Thomas Indlekofer, Michael Schnittger, Sybille Hellebrand:
Efficient test response compaction for robust BIST using parity sequences. ICCD 2010: 480-485 - [c30]Viktor Froese, Rüdiger Ibers, Sybille Hellebrand:
Reusing NoC-infrastructure for test data compression. VTS 2010: 227-231
2000 – 2009
- 2009
- [c29]Sybille Hellebrand, Marc Hunger:
Are Robust Circuits Really Robust? DFT 2009: 77-77 - [c28]Marc Hunger, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, Bernd Becker
:
ATPG-based grading of strong fault-secureness. IOLTS 2009: 269-274 - 2008
- [c27]Marc Hunger, Sybille Hellebrand:
Verification and Analysis of Self-Checking Properties through ATPG. IOLTS 2008: 25-30 - [c26]Philipp Öhler, Alberto Bosio, Giorgio Di Natale, Sybille Hellebrand:
A Modular Memory BIST for Optimized Memory Repair. IOLTS 2008: 171-172 - [c25]Uranmandakh Amgalan, Christian Hachmann
, Sybille Hellebrand, Hans-Joachim Wunderlich:
Signature Rollback - A Technique for Testing Robust Circuits. VTS 2008: 125-130 - 2007
- [j10]Muhammad Ali, Michael Welzl
, Sven Hessler, Sybille Hellebrand:
An efficient fault tolerant mechanism to deal with permanent and transient failures in a network on chip. Int. J. High Perform. Syst. Archit. 1(2): 113-123 (2007) - [c24]Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich:
Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair. DDECS 2007: 185-190 - [c23]Sybille Hellebrand, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, Bernd Straube:
A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction. DFT 2007: 50-58 - [c22]Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich:
An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. ETS 2007: 91-96 - 2006
- [j9]Bernd Becker
, Ilia Polian, Sybille Hellebrand, Bernd Straube, Hans-Joachim Wunderlich:
DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems). it Inf. Technol. 48(5): 304- (2006) - 2005
- [c21]Philipp Öhler, Sybille Hellebrand:
Low power embedded DRAMs with high quality error correcting capabilities. ETS 2005: 148-153 - 2004
- [c20]Armin Würtenberger, Christofer S. Tautermann, Sybille Hellebrand:
Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. ITC 2004: 926-935 - 2003
- [c19]Armin Würtenberger, Christofer S. Tautermann, Sybille Hellebrand:
A Hybrid Coding Strategy For Optimized Test Data Compression. ITC 2003: 451-459 - 2002
- [j8]Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich:
Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. J. Electron. Test. 18(2): 159-170 (2002) - [j7]Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich:
A Mixed-Mode BIST Scheme Based on Folding Compression. J. Comput. Sci. Technol. 17(2): 203-212 (2002) - [j6]Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik:
Efficient Online and Offline Testing of Embedded DRAMs. IEEE Trans. Computers 51(7): 801-809 (2002) - 2001
- [j5]Sybille Hellebrand, Huaguo Liang, Hans-Joachim Wunderlich:
A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. J. Electron. Test. 17(3-4): 341-349 (2001) - [c18]Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich:
Two-dimensional test data compression for scan-based deterministic BIST. ITC 2001: 894-902 - 2000
- [c17]Sybille Hellebrand, Hans-Joachim Wunderlich, Huaguo Liang:
A mixed mode BIST scheme based on reseeding of folding counters. ITC 2000: 778-784
1990 – 1999
- 1999
- [c16]Sybille Hellebrand, Hans-Joachim Wunderlich, Vyacheslav N. Yarmolik:
Symmetric Transparent BIST for RAMs. DATE 1999: 702-707 - [c15]Vyacheslav N. Yarmolik, I. V. Bykov, Sybille Hellebrand, Hans-Joachim Wunderlich:
Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms. EDCC 1999: 339-350 - [c14]Sybille Hellebrand, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, Vyacheslav N. Yarmolik:
Error Detecting Refreshment for Embedded DRAMs. VTS 1999: 384-390 - 1998
- [j4]Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig:
Synthesizing Fast, Online-Testable Control Units. IEEE Des. Test Comput. 15(4): 36-41 (1998) - [j3]Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig:
Mixed-Mode BIST Using Embedded Processors. J. Electron. Test. 12(1-2): 127-138 (1998) - [c13]Vyacheslav N. Yarmolik, Sybille Hellebrand, Hans-Joachim Wunderlich:
Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs. DATE 1998: 173-179 - [c12]Andre Hertwig, Sybille Hellebrand, Hans-Joachim Wunderlich:
Fast Self-Recovering Controllers. VTS 1998: 296-302 - 1997
- [c11]Kun-Han Tsai, Sybille Hellebrand, Janusz Rajski, Malgorzata Marek-Sadowska:
STARBIST: Scan Autocorrelated Random Pattern Generation. DAC 1997: 472-477 - 1996
- [c10]Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig:
Mixed-Mode BIST Using Embedded Processors. ITC 1996: 195-204 - 1995
- [j2]Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois:
Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Trans. Computers 44(2): 223-233 (1995) - [c9]Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, Hans-Joachim Wunderlich:
Pattern generation for a deterministic BIST scheme. ICCAD 1995: 88-94 - 1994
- [c8]Sybille Hellebrand, Hans-Joachim Wunderlich:
Synthesis of Self-Testable Controllers. EDAC-ETC-EUROASIC 1994: 580-585 - [c7]Sybille Hellebrand, Hans-Joachim Wunderlich:
An efficient procedure for the synthesis of fast self-testable controller structures. ICCAD 1994: 110-116 - 1992
- [j1]Hans-Joachim Wunderlich, Sybille Hellebrand:
The pseudoexhaustive test of sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(1): 26-33 (1992) - [c6]Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski:
Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. ITC 1992: 120-129 - 1991
- [b1]Sybille Hellebrand:
Synthese vollstaendig testbarer Schaltungen. Karlsruhe University, Germany, 1991 - 1990
- [c5]Sybille Hellebrand, Hans-Joachim Wunderlich:
Tools and devices supporting the pseudo-exhaustive test. EURO-DAC 1990: 13-17 - [c4]Sybille Hellebrand, Hans-Joachim Wunderlich, Oliver F. Haberl:
Generating pseudo-exhaustive vectors for external testing. ITC 1990: 670-679
1980 – 1989
- 1989
- [c3]Sybille Hellebrand, Hans-Joachim Wunderlich:
The Pseudo-Exhaustive Test of Sequential Circuits. ITC 1989: 19-27 - 1988
- [c2]Hans-Joachim Wunderlich, Sybille Hellebrand:
Generating pattern sequences for the pseudo-exhaustive test of MOS-circuits. FTCS 1988: 36-41 - [c1]Sybille Hellebrand, Hans-Joachim Wunderlich:
Automatisierung des Entwurfs vollständig testbarer Schaltungen. GI Jahrestagung (2) 1988: 145-159
Coauthor Index
![](https://dblp.dagstuhl.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-07-20 20:30 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint