BibTeX records: Peter M. Osterberg

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@inproceedings{DBLP:conf/iscas/InanO05,
  author    = {Aziz S. Inan and
               Peter M. Osterberg},
  title     = {Special singularity integrals encountered in electric circuits {[RLC}
               circuit examples]},
  booktitle = {International Symposium on Circuits and Systems {(ISCAS} 2005), 23-26
               May 2005, Kobe, Japan},
  pages     = {976--979},
  publisher = {{IEEE}},
  year      = {2005},
  url       = {https://doi.org/10.1109/ISCAS.2005.1464753},
  doi       = {10.1109/ISCAS.2005.1464753},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/conf/iscas/InanO05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/InanO02,
  author    = {Aziz S. Inan and
               Peter M. Osterberg},
  title     = {Revisiting the sifting integral: an interesting special case},
  booktitle = {Proceedings of the 2002 International Symposium on Circuits and Systems,
               {ISCAS} 2002, Scottsdale, Arizona, USA, May 26-29, 2002},
  pages     = {547--550},
  publisher = {{IEEE}},
  year      = {2002},
  url       = {https://doi.org/10.1109/ISCAS.2002.1010282},
  doi       = {10.1109/ISCAS.2002.1010282},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/conf/iscas/InanO02.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@phdthesis{DBLP:phd/ndltd/Osterberg95,
  author    = {Peter M. Osterberg},
  title     = {Electrostatically actuated microelectromechanical test structures
               for material property measurement},
  school    = {Massachusetts Institute of Technology, Cambridge, MA, {USA}},
  year      = {1995},
  url       = {http://hdl.handle.net/1721.1/11097},
  timestamp = {Mon, 08 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/phd/ndltd/Osterberg95.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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