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T. Shimono

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1980 – 1989

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1986
[c2]
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Masato Kawai, T. Shimono, Shigehiro Funatsu:
Test Data Quality Assurance. ITC 1986: 848-852
1985
[c1]
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T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, Shigehiro Funatsu:
An AC/DC Test Generation System for Gate Array LSIs. ITC 1985: 329-333

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