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Wern-Yih Duh

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1990 – 1999

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1998
[c1]
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Kuen-Jong Lee, Jing-Jou Tang, Wern-Yih Duh:
On the Determination of Threshold Voltages for CMOS Gates to Facilitate Test Pattern Generation and Fault Simulation. Asian Test Symposium 1998: 113-118

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