BibTeX record conf/aspdac/DamarlaSMCS95

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@inproceedings{DBLP:conf/aspdac/DamarlaSMCS95,
  author       = {T. Raju Damarla and
                  Wei Su and
                  Gerald T. Michael and
                  Moon J. Chung and
                  Charles E. Stroud},
  editor       = {Isao Shirakawa},
  title        = {A built-in self test scheme for {VLSI}},
  booktitle    = {Proceedings of the 1995 Conference on Asia Pacific Design Automation,
                  Makuhari, Massa, Chiba, Japan, August 29 - September 1, 1995},
  publisher    = {{ACM}},
  year         = {1995},
  url          = {https://doi.org/10.1145/224818.224901},
  doi          = {10.1145/224818.224901},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/aspdac/DamarlaSMCS95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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